SLVK268 June   2026 OPA4H838-SEP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1Introduction
  5. 2Single-Event Effects (SEE)
  6. 3Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Test Setup and Procedures
  9. 6Destructive Single-Event Effects (DSEE)
    1. 6.1 Single-Event Latch-up (SEL) Results
  10. 7Single-Event Transients (SET)
  11. 8Summary
  12. 9References

6.1 Single-Event Latch-up (SEL) Results

All SEL characterizations are performed with forced hot air to maintain the die temperature at 125°C during the tests. The temperature of the die is verified using thermal camera prior to exposure to heavy ions.

The device is exposed to the heavy-ion beam incident on the die surface at 0°. The distance between the device and the beam is 40mm to achieve an effective LET of 45.6MeV-cm2/mg. A flux of 105 ions/cm2 -s and fluence of 107 ions/cm2 per run is used in all runs.

The device is powered up and exposed to the heavy-ions using the maximum recommended maximum supply voltage of 5.5V. The device is configured as a buffer amplifier, with the output connected to the inverting input, and the common-mode voltage set to 2.75V. The outputs are unloaded. No SEL events are observed during all ten runs.

Table 6-1 shows the SEL test conditions and results. Figure 6-1 shows a plot of the current vs time for runs 9, 12 and 15.

Table 6-1 OPA4H838-SEP SEL Conditions and Results
Run DUT Ion LETEFF
(MeV-cm2/mg)		 Effective Fluence
(ions/cm2)		 Average Flux
(ions/cm2 ·s)		 Result
8 2 109Ag 45.6 1.001E+07 1.074E+05 Pass
9 2 109Ag 45.6 9.947E+06 1.059E+05 Pass
10 2 109Ag 45.6 1.000E+07 1.178E+04 Pass
11 2 109Ag 45.6 9.985E+06 1.291E+05 Pass
12 3 109Ag 45.6 1.001E+07 1.288E+05 Pass
13 3 109Ag 45.6 1.004E+07 1.273E+05 Pass
14 3 109Ag 45.6 1.004E+07 1.305E+05 Pass
15 4 109Ag 45.6 9.986E+06 1.110E+05 Pass
16 4 109Ag 45.6 1.003E+07 1.189E+05 Pass
17 4 109Ag 45.6 1.001E+07 1.253E+05 Pass

Using the MFTF method described in Single-Event Effects (SEE) Confidence Interval Calculations application report and combining (or summing) the fluences of the 10 runs at 125°C (10 × 107), the upper-bound cross-section (using a 95% confidence level) is calculated as:

σSEL ≤ 3.69 × 107 cm2/device for LETEFF = 45.6MeV×cm2/mg and T = 125°C.

OPA4H838-SEP Run 9: Total Positive Supply Current versus Time Figure 6-1 Run 9: Total Positive Supply Current versus Time
OPA4H838-SEP Run 9: Input Bias Current versus Time (All Channels) Figure 6-2 Run 9: Input Bias Current versus Time (All Channels)
OPA4H838-SEP Run 12: Total Positive Supply Current versus Time Figure 6-3 Run 12: Total Positive Supply Current versus Time
OPA4H838-SEP Run 12 Input Bias Current versus Time (All Channels) Figure 6-4 Run 12 Input Bias Current versus Time (All Channels)
OPA4H838-SEP Run 15 Total Positive Supply Current versus Time Figure 6-5 Run 15 Total Positive Supply Current versus Time
OPA4H838-SEP Run 15 Input Bias Current versus Time (All Channels) Figure 6-6 Run 15 Input Bias Current versus Time (All Channels)