SLVK262A February   2026  – May 2026 TPS7H5030-SEP , TPS7H5031-SEP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 LETEFF and Range Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
    1. 8.1 Open-Loop Configuration
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A References
  15.   B Revision History

7.1 Single-Event Latch-up (SEL) Results

During the SEL testing the device was heated to 125°C by using PID controlled heat gun (MISTRAL 6 System [120V, 2400W]). The die temperature was verified using a standalone FLIR thermal camera prior to exposure to heavy ions at KSEE.

The species used for the SEL testing was 109Ag at 19.5MeV/nucleon at KSEE and 109Ag at 15MeV/nucleon at TAMU. An angle of incidence of 0° was used to achieve a LETEFF of approximately 48MeV·cm2/mg. The kinetic energy in the vacuum for 109Ag (KSEE) is 2.125GeV and 109Ag (TAMU) is 1.635GeV. Flux of approximately 105 ions/cm2/s and a fluence of approximately 107 ions/cm2 per run was used. Run duration to achieve this fluence was approximately two minutes. Eight devices were powered up and exposed to the heavy-ions using the maximum recommended input voltage of 14V and a fixed VLDO voltage of 5V. No SEL events were observed during all four runs, indicating that the TPS7H503x-SEP is SEL-free up to 75MeV × cm2/mg. Table 8-4 shows the SEL test conditions and results. Figure 7-1 shows a plot of the current versus time for run #1.

Table 7-1 Summary of TPS7H503x-SEP SEL Test Condition and Results
Run #Unit #FacilityDevice TypeIonLETEFF (MeV × cm2/mg)Flux (ions/cm2/s)Fluence (ions/cm2)VIN/PVIN (V)VLDO (V)SEL (# Events)
11KSEETPS7H5030-SEP109Ag49.11.10 × 1051.00 × 1071450
22KSEETPS7H5030-SEP109Ag49.11.06 × 1051.00 × 1071450
33KSEETPS7H5030-SEP109Ag49.18.77 × 1041.00 × 1071450
44KSEETPS7H5030-SEP109Ag49.18.19 × 1041.00 × 1071450
55TAMUTPS7H5030-SEP109Ag47.71.34 × 1051.00 × 1071450
66TAMUTPS7H5030-SEP109Ag47.71.27 × 1051.00 × 1071450
258KSEETPS7H5031-SEP109Ag49.11.11 × 1051.00 × 1071450
269KSEETPS7H5031-SEP109Ag49.11.08 × 1051.00 × 1071450

Using the MFTF method described in Single-Event Effects (SEE) Confidence Interval Calculations application report and combining (or summing) the fluences of the eight runs at 125°C (8 × 107 ions/cm2), the upper-bound cross section (using a 95% confidence level) is calculated as:

σSEL ≤ 4.61 × 10-8 cm2/device for LETEFF = 48MeV × cm2/mg and T = 125°C.

Current versus Time for Run #1 (SEL) of the TPS7H5030-SP at T = 125°CFigure 7-1 Current versus Time for Run #1 (SEL) of the TPS7H5030-SP at T = 125°C