The INA1H94-SEP was biased in a variety of different conditions for SEE testing, at both the recommended minimum and recommended maximum supply voltages. Midsupply or GND was used for both REF_A and REF_B. Current was monitored over time for both supplies V+, V- and the instrumentation amplifier inputs -IN and +IN.

Input and supply voltages were provided by SMU PXI cards, connected with banana cables. The board used for testing incorporated jumpers to allow testing with high V_CM and 0V V_DIFF; low V_CM and high V_DIFF; and high V_CM and constant V_DIFF. For all testing, the device outputs were monitored using oscilloscope PXI cards, connected with BNC cables. A 100Ω of series isolation resistance was used to drive the cable capacitance. A 2kΩ output load to midsupply was present for all DUTs.

An example of the INA1H94-SEP device mounted through a socket on a characterization board is shown in Figure 4-3. During SEL qualification, the device was heated using forced hot air, maintaining an IC temperature at 125°C. During SEL testing, the devices were soldered into a coupon board, allowing direct airflow access to the heater. For SET testing, devices were mounted in a socket for the easy exchange of units.