SLVK245 December   2025 INA1H94-SEP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1Overview
  5. 2SEE Mechanisms
  6. 3Irradiation Facilities and Telemetry
  7. 4Test Device and Test Board Information
    1. 4.1 Qualification Circuits and Boards
    2. 4.2 Characterization Devices and Test Board Schematics
  8. 5Results
    1. 5.1 SEL Qualification Results
    2. 5.2 SET Characterization Results: TAMU K500 Cyclotron
    3. 5.3 Analysis
  9. 6Summary
  10.   A Texas A&M University Results Appendix
  11.   B References

6 Summary

Single-event effects of the INA1H94-SEP radiation-hardened, high common-mode voltage difference amplifier were studied. The device was shown through characterization to be latch-up immune up to surface LETEFF = 43MeV-cm2 / mg and T = 125°C.