Heavy ions were used to irradiate the devices. A nominal flux of 1.3 × 10⁵ ions / s-cm² was used for SEL characterization, at 125°C die temperature. Nominal flux of 1 × 10⁵ ions / s-cm² was used for SET characterization, at ambient temperature.

For SEE characterization, the INA1H94-SEP was biased with bipolar split supplies. The circuit was connected as shown on Figure 4-4. Different supply voltages, input common-mode voltages and differential voltage conditions were tested.

Figure 4-4 SEE Characterization Circuit Block Diagram

Input and supply voltages were provided by SMU PXI cards, connected with banana cables. Figure 4-5 shows the decoupling supply capacitance scheme used. Current was monitored over time for both V+ and V-.

Figure 4-5 Characterization Board Voltage Supply Connections

The positive and negative inputs of the difference amplifier are driven with separate SMU sources, allowing control of the differential and common-mode voltage input signals.Figure 4-5 shows the input SMU connections and optional filters.

Figure 4-6 Characterization Board Input Connections

For SET testing, the device outputs were monitored using oscilloscope PXI cards, connected with BNC cables. 100Ω of series isolation resistance was used on the output channel to drive the cable capacitance. Figure 4-5 shows the output oscilloscope connections and optional load resistors and capacitors.

Figure 4-7 Characterization Board Output Connections