SLVK226 October 2025 TPS7H4012-SEP
- 1
- TPS7H4012-SEP and TPS7H4013-SEP Single-Event Effects (SEE)
- Trademarks
- 1 Introduction
- 2 Single-Event Effects (SEE)
- 3 Device and Test Board Information
- 4 Irradiation Facility and Setup
- 5 LETEFF and Range Calculation
- 6 Test Setup and Procedures
- 7 Destructive Single-Event Effects (DSEE)
- 8 Single-Event Transients (SET)
- 9 Event Rate Calculations
- 10Summary
- A References
8 Single-Event Transients (SET)
SETs are defined as heavy-ion-induced transients upsets on the VOUT, SS_TR, or PWRGD of the TPS7H401x-SEP.
The species used for the SET testing was 109Ag (TAMU) at 15 MeV/nucleon and 109Ag (KSEE) at 19.5 MeV/nucleon. For both ions an angle of incidence of 0° was used to achieve a LETEFF of ≈ 48 MeV×cm2/mg (for more details refer to Table 5-1). Flux of ≈105 ions/cm2/s and a fluence of 107 ions/cm2, per run were used for the SET characterization discussed on this chapter. Over the course of testing seven devices, not a single transient or SEFI was recorded on any of the monitored signals during the VIN = 12V case indicating that the TPS7H401x-SEP is SET/SEFI free up to LETEFF = 48 MeV×cm2/ mg at VIN = 12V.
During the VIN = 5V case the two TPS7H4013-SEP units that were tested under this condition recorded normal transients greater than 3%. These transients are listed and characterized in tables and figures below. All transients recovered on their own without the need for external intervention and all magnitudes and recovery times are shown in the histogram plots below. Please note that the TPS7H4013EVM has less output capacitance than the TPS7H4012EVM. Please refer to the EVM schematics shown in the Device and Test Board section and the SEE test block diagrams in the Test Setup and Procedures section to compare the output capacitances and see the delta in output transient performance under the diferent bias conditions.
Waveform size, sample rate, trigger type, value, and signal for all scopes used is presented on Table 8-1.
| Scope Model | Trigger Signal | Trigger Type | Trigger Value | Record Length | Sample Rate |
|---|---|---|---|---|---|
| PXIe-5172 (1) | VOUT | Window | ±3% | 50k | 100MS/s |
| PXIe-5172 (2) | SS_TR | Edge/Negative | 50% | 50k | 100MS/s |
| PXIe-5172 (3) | PWRGD | Edge/Negative | 50% | 50k | 100MS/s |
Device | Run Number | Unit Number | Facility | Ion | LETEFF (MeV × cm2/mg) | VIN (V) | Flux (ions/cm2/s) | Fluence (ions /cm2) | VOUT SET ≥ |3%| (#) | SS_TR SET (#) | PWRGD SET (#) |
|---|---|---|---|---|---|---|---|---|---|---|---|
TPS7H4012-SEP | 22 | 1 | TAMU | 109Ag | 48 | 12 | 1.07 × 105 | 1.00 × 107 | 0 | 0 | 0 |
23 | TAMU | 109Ag | 48 | 5 | 1.02 × 105 | 1.00 × 107 | 0 | 0 | 0 | ||
24 | 2 | TAMU | 109Ag | 48 | 12 | 9.41 × 104 | 1.00 × 107 | 0 | 0 | 0 | |
25 | TAMU | 109Ag | 48 | 5 | 9.32 × 104 | 1.00 × 107 | 0 | 0 | 0 | ||
TPS7H4013-SEP | 26 | 3 | TAMU | 109Ag | 48 | 12 | 1.17 × 105 | 1.00 × 107 | 0 | 0 | 0 |
27 | TAMU | 109Ag | 48 | 5 | 1.22 × 105 | 1.00 × 107 | 38 | 0 | 0 | ||
28 | 4 | TAMU | 109Ag | 48 | 12 | 1.26 × 105 | 1.00 × 107 | 0 | 0 | 0 | |
29 | TAMU | 109Ag | 48 | 5 | 1.31 × 105 | 1.00 × 107 | 89 | 0 | 0 | ||
TPS7H4012-SEP | 30 | 5 | KSEE | 109Ag | 48 | 12 | 1.08 × 105 | 1.00 × 107 | 0 | 0 | 0 |
31 | 6 | KSEE | 109Ag | 48 | 12 | 1.07 × 105 | 1.00 × 107 | 0 | 0 | 0 | |
TPS7H4013-SEP | 32 | 7 | KSEE | 109Ag | 48 | 12 | 5.89 × 104 | 1.00 × 107 | 0 | 0 | 0 |
Figure 8-1 TPS7H4013-SEP VOUT SET for Run 29 (VIN=5V)
Figure 8-2 TPS7H4013-SEP VOUT SET Voltage Deviation (%) Histogram
Figure 8-3 TPS7H4013-SEP VOUT SET Transient Duration (s) HistogramDevice | VIN (V) | # SETs | Fluence (ions/cm2/s) | Upper-Bound Cross-Section (cm2) |
|---|---|---|---|---|
TPS7H4012-SEP | 5 | 0 | 2.00 × 107 | 1.84 × 10-7 |
12 | 0 | 4.00 × 107 | 9.22 × 10-8 | |
TPS7H4013-SEP | 5 | 127 | 2.00 × 107 | 7.56 × 10-6 |
12 | 0 | 3.00 × 107 | 1.23 × 10-7 |