SLVK199A August 2025 – August 2026 TPS7H3024-SP , TPS7H3034-SP , TPS7H3134-SP
During SEB/SEGR testing, the device was tested at room temperature. The same test conditions, in terms of biasing and voltage levels, apply for SEB/SEGR as was used during the SEL testing. In the case of the SEB/SEGR the device was tested in the following state machine states:
For more configuration information, please refer to Table 6-1.
The device was also configured in the following 4 different operating modes. Table 8-5 showcases the operating modes used on the units during testing.
| RUN # | UNIT # | DEVICE | MODE | WD |
|---|---|---|---|---|
13 | 1 | TPS7H3024-SP | 0 | SW |
14 | ||||
15 | 2 | TPS7H3024-SP | 0 | OFF |
16 | ||||
17 | 3 | TPS7H3024-SP | 1 | SW |
18 | ||||
19 | 4 | TPS7H3024-SP | 1 | OFF |
20 | ||||
21 | 5 | TPS7H3024-SP | 0 | OFF |
22 | ||||
23 | 6 | TPS7H3024-SP | 1 | OFF |
24 | ||||
25 | 7 | TPS7H3124-SP | 0 | OFF |
26 | ||||
27 | 8 | TPS7H3124-SP | 0 | SW |
28 | ||||
29 | 9 | TPS7H3134-SP | 1 | OFF |
30 | ||||
31 | 10 | TPS7H3134-SP | 1 | SW |
32 | ||||
33 | 11 | TPS7H3034-SP | 0 | OFF |
34 | ||||
35 | 12 | TPS7H3034-SP | 0 | SW |
36 |
The results for 24 runs across 12 devices for SEB/SEGR are shown in Table 8-5. Over all 24 runs, none of the 12 units exhibited any SEB/SEGR failures, indicating the TPS7H3XX4-SP is SEB/SEGR free at 75 MeV·cm2/mg. Typical VIN current vs time plots for SEB/SEGR on and off runs are shown in Figure 7-5 and Figure 7-6. Typical VPULL_UPx current vs time plots for SEB/SEGR on and off runs are shown in Figure 7-3 through Figure 7-6.
| RUN # | UNIT # | FACILITY | ION | LETEFF (MeV·cm2/mg) | FLUX (ions/(cm2·s)) | FLUENCE (ions/cm2) | ON/OFF STATUS |
SEB EVENT? |
|---|---|---|---|---|---|---|---|---|
| 13 |
1 |
TAMU |
165Ho |
75 |
5.70 × 104 |
1.00 × 107 |
On |
No |
|
14 |
5.21 × 104 |
Off |
||||||
|
15 |
2 |
TAMU |
165Ho |
75 |
5.55 × 104 |
1.00 × 107 |
On |
No |
|
16 |
5.26 × 104 | Off | ||||||
|
17 |
3 |
TAMU |
165Ho |
75 |
5.76 × 104 |
1.00 × 107 |
On |
No |
|
18 |
5.86 × 104 | Off | ||||||
|
19 |
4 |
TAMU |
165Ho |
75 |
5.95 × 104 | 1.00 × 107 |
On |
No |
|
20 |
5.63 × 104 | Off | ||||||
|
21 |
5 |
KSEE |
169Tm |
75.1 |
1.05 × 105 | 1.00 × 107 | On | No |
|
22 |
1.04 × 105 |
Off | ||||||
|
23 |
6 |
KSEE |
169Tm |
75.1 |
9.98 × 104 | 1.00 × 107 | On | No |
|
24 |
9.44 × 104 | Off | ||||||
|
25 |
7 |
KSEE |
169Tm |
75.1 |
1.16 × 105 | 1.00 × 107 | On | No |
|
26 |
1.15 × 105 | Off | ||||||
|
27 |
8 |
KSEE |
169Tm |
75.1 |
1.13 × 105 | 1.00 × 107 | On | No |
|
28 |
1.17 × 105 | Off | ||||||
|
29 |
9 |
KSEE | 169Tm | 75.1 | 1.19 × 105 | 1.00 × 107 | On | No |
|
30 |
1.15 × 105 | Off | ||||||
|
31 |
10 |
KSEE | 169Tm | 75.1 | 1.14 × 105 | 1.00 × 107 | On | No |
|
32 |
1.08 × 105 | Off | ||||||
|
33 |
11 |
KSEE | 169Tm | 75.1 | 1.01 × 105 | 1.00 × 107 | On | No |
|
34 |
1.02 × 105 | Off | ||||||
|
35 |
12 |
KSEE | 169Tm | 75.1 | 1.11 × 105 | 1.00 × 107 | On | No |
|
36 |
1.08 × 105 | Off |
Using the MFTF method described in Single-Event Effects (SEE) Confidence Interval Calculations application report, the upper-bound cross-section (using a 95% confidence level) is calculated as:
σSEB ≤ 1.54 × 10–8 cm2/device for LETEFF = 75 MeV·cm2/mg and T = 25°C.