SLVK199A August   2025  – August 2026 TPS7H3024-SP , TPS7H3034-SP , TPS7H3134-SP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 LETEFF and Range Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-Up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A References
  15.   B Revision History

Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results

During SEB/SEGR testing, the device was tested at room temperature. The same test conditions, in terms of biasing and voltage levels, apply for SEB/SEGR as was used during the SEL testing. In the case of the SEB/SEGR the device was tested in the following state machine states:

  • Disabled (SR_UVLO = 0V)
    • All outputs are low (RESETx = Low and PWRGD = Low)
  • Enabled (SR_UVLO = 1V)
    • All outputs are high (RESETx = High and PWRGD = High)

For more configuration information, please refer to Table 6-1.

The device was also configured in the following 4 different operating modes. Table 8-5 showcases the operating modes used on the units during testing.

  1. MODE 0, WD SW
  2. MODE 0, WD Off
  3. MODE 1, WD SW
  4. MODE 1, WD Off

Table 7-3 Operating Modes Used for SEB/SEGR Testing on TPS7H3XX4-SP
RUN #UNIT #

DEVICE

MODE

WD

13

1

TPS7H3024-SP

0

SW

14

15

2

TPS7H3024-SP

0

OFF

16

17

3

TPS7H3024-SP

1

SW

18

19

4

TPS7H3024-SP

1

OFF

20

21

5

TPS7H3024-SP

0

OFF

22

23

6

TPS7H3024-SP

1

OFF

24

25

7

TPS7H3124-SP

0

OFF

26

27

8

TPS7H3124-SP

0

SW

28

29

9

TPS7H3134-SP

1

OFF

30

31

10

TPS7H3134-SP

1

SW

32

33

11

TPS7H3034-SP

0

OFF

34

35

12

TPS7H3034-SP

0

SW

36

The results for 24 runs across 12 devices for SEB/SEGR are shown in Table 8-5. Over all 24 runs, none of the 12 units exhibited any SEB/SEGR failures, indicating the TPS7H3XX4-SP is SEB/SEGR free at 75 MeV·cm2/mg. Typical VIN current vs time plots for SEB/SEGR on and off runs are shown in Figure 7-5 and Figure 7-6. Typical VPULL_UPx current vs time plots for SEB/SEGR on and off runs are shown in Figure 7-3 through Figure 7-6.

Table 7-4 Summary of TPS7H3XX4-SP SEB/SEGR Test Condition and Results
RUN # UNIT # FACILITY ION LETEFF (MeV·cm2/mg) FLUX (ions/(cm2·s)) FLUENCE (ions/cm2) ON/OFF STATUS

SEB EVENT?

13

1

TAMU

165Ho

75

5.70 × 104

1.00 × 107

On

No

14

5.21 × 104

Off

15

2

TAMU

165Ho

75

5.55 × 104

1.00 × 107

On

No

16

5.26 × 104 Off

17

3

TAMU

165Ho

75

5.76 × 104

1.00 × 107

On

No

18

5.86 × 104 Off

19

4

TAMU

165Ho

75

5.95 × 104 1.00 × 107

On

No

20

5.63 × 104 Off

21

5

KSEE

169Tm

75.1

1.05 × 105 1.00 × 107 On No

22

1.04 × 105

Off

23

6

KSEE

169Tm

75.1

9.98 × 104 1.00 × 107 On No

24

9.44 × 104 Off

25

7

KSEE

169Tm

75.1

1.16 × 105 1.00 × 107 On No

26

1.15 × 105 Off

27

8

KSEE

169Tm

75.1

1.13 × 105 1.00 × 107 On No

28

1.17 × 105 Off

29

9

KSEE 169Tm 75.1 1.19 × 105 1.00 × 107 On No

30

1.15 × 105 Off

31

10

KSEE 169Tm 75.1 1.14 × 105 1.00 × 107 On No

32

1.08 × 105 Off

33

11

KSEE 169Tm 75.1 1.01 × 105 1.00 × 107 On No

34

1.02 × 105 Off

35

12

KSEE 169Tm 75.1 1.11 × 105 1.00 × 107 On No

36

1.08 × 105 Off

Using the MFTF method described in Single-Event Effects (SEE) Confidence Interval Calculations application report, the upper-bound cross-section (using a 95% confidence level) is calculated as:

σSEB ≤ 1.54 × 10–8 cm2/device for LETEFF = 75 MeV·cm2/mg and T = 25°C.

 Current versus Time for IIN: SEB On (Mode 0, WD Off) Run #7Figure 7-3 Current versus Time for IIN: SEB On (Mode 0, WD Off) Run #7
 Current versus Time for IIN: SEB Off (Mode 0, WD Off) Run #8Figure 7-4 Current versus Time for IIN: SEB Off (Mode 0, WD Off) Run #8
 Current versus Time for IIN: SEB On (Mode 1, WD SW) Run #9Figure 7-5 Current versus Time for IIN: SEB On (Mode 1, WD SW) Run #9
 Current versus Time for IIN: SEB Off (Mode 1, WD SW) Run #10Figure 7-6 Current versus Time for IIN: SEB Off (Mode 1, WD SW) Run #10