SLVK199A August   2025  – August 2026 TPS7H3024-SP , TPS7H3034-SP , TPS7H3134-SP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 LETEFF and Range Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-Up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A References
  15.   B Revision History

B Revision History

Changes from Revision * (August 2025) to Revision A (August 2026)

  • Expanded the report scope to include three additional device variants and incorporate newly collected heavy-ion irradiation data. The document now covers the TPS7H3124-SP, TPS7H3034-SP, and TPS7H3134-SP to provide a more comprehensive SEE characterization.Go