SLVK197 April   2026 SN54SC1G08-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Overview
  5. 2Single-Event Effects (SEE)
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Results
    1. 5.1 Single-Event Latch-up (SEL) Results
    2. 5.2 Single-Event Transients (SET) Results
  9. 6Event Rate Calculations
  10. 7Summary
  11. 8References

1 Overview

The SN54SC1G08-SEP is a radiation tolerant contains 2-input positive AND gate device and performs the Boolean function or . This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.

For more information, see the SN54SC1G08-SEP product page.

Table 1-1 Overview Information
DescriptionDevice Information
TI Part NumberSN54SC1G08-SEP
Orderable Part NumberSN54SC1G08MDBVTSEP
VID Number

V62/26601-01XE

Device FunctionRadiation-tolerant, Single 2-Input Positive-AND Gate
TechnologyLBC9
Exposure Facility (SET)Facility for Rare Isotope Beams (FRIB) at Michigan State University – FRIB Single Event Effects (FSEE) Facility
Exposure Facility (SEL)K500 Cyclotron at

Michigan State University

Heavy Ion Fluence per Run1 × 107 ions / cm2
Irradiation Temperature25°C (for SET testing) and 125°C (for SEL testing)