SLVK197 April   2026 SN54SC1G08-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Overview
  5. 2Single-Event Effects (SEE)
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Results
    1. 5.1 Single-Event Latch-up (SEL) Results
    2. 5.2 Single-Event Transients (SET) Results
  9. 6Event Rate Calculations
  10. 7Summary
  11. 8References

Abstract

The purpose of this study is to characterize the single-event-effects (SEE) performance due to heavy-ion irradiation of the SN54SC1G08-SEP. SEE performance was verified at minimum (1.1V) and maximum (5.5V) operating conditions. Heavy-ions with an LETEFF of 47MeV-cm2/ mg were used to irradiate three production devices with a fluence of 1 × 107 ions / cm2. The results demonstrate that the SN54SC1G08-SEP is SEL-free up to LETEFF = 47MeV-cm2 / mg as 125°C. SET performance at minimum and maximum operating voltages saw no excursions ≥ |2%| trigger up to fluence of 1 × 107 ions / cm2, as shown and discussed in this report.

The SN54SC1G08-SEP Single-Event Effects (SEE) radiation report covers the SEE performance of all three devices listed below.The SN54SC1G08-SEP device covers all functional blocks and active die area of the other two devices, which is why the device was selected for single-event effect testing for this group of devices.

  • SN54SC1G08-SEP

  • SN54SC1G00-SEP

  • SN54SC1G32-SEP