SLVK183 February   2025 TPS7H6005-SP , TPS7H6015-SP , TPS7H6025-SP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A References

7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results

During the SEB/SEGR characterization, the device was tested at room temperature of approximately 25°C. The device was tested under both the enabled and disabled mode. For the SEB-OFF mode the device was disabled using the EN-pin by forcing 0V while in PWM mode and by holding both inputs low during the IIM mode testing. During the SEB/SEGR testing with the device enabled or disabled, not a single input current event was observed.

The species used for the SEB testing was Homium (165Ho at 15 MeV/nucleon). For the 165Ho ion an angle of incidence of 0° was used to achieve an LETEFF = 75 MeV × cm2 / mg (for more details, see Table 8-4). The kinetic energy in the vacuum for this ion is 2.474GeV (15-MeV / amu line). Flux of approximately 105 ions / cm2 × s and a fluence of approximately 107 ions / cm2 was used for the run. Run duration to achieve this fluence was approximately two minutes. The four devices (same as used in SEL testing) were powered up and exposed to the heavy-ions using the maximum recommended input voltage and boot voltage of 14V. The ASW (High-Side Driver Signal Return) was set to 150V. The device was set in both PWM and IIM modes during testing. For more information, see Single-Event Effects section. No SEB/SEGR current events were observed during the 12 runs, indicating that the TPS7H60x5-SP is SEB/SEGR-free up to LETEFF = 75 MeV × cm2/ mg and across the full electrical specifications. Summary of TPS7H60x5-SP SEB/SEGR Test Condition and Results shows the SEB/SEGR test conditions and results.

Table 7-2 Summary of TPS7H60x5-SP SEB/SEGR Test Condition and Results
Run Number Unit NumberVariantIonLETEFF (MeV × cm2 / mg)Flux (ions × cm2 / s)Fluence (ions / cm2)Enabled StatusVIN

(V)

VBOOT

(V)

ModeSwitching FrequencySEB Event?
15

1

TPS7H6005165Ho756.11 × 1041 × 107EN1414PWM500kHzNo

16

1

TPS7H6005165Ho

75

6.23 × 104

1 × 107EN1414PWM

1MHz

No

17

2

TPS7H6005165Ho

75

6.74 × 104

1 × 107EN1414PWM

2MHz

No

18

2

TPS7H6005165Ho756.44 × 1041 × 107DIS1414PWMN/ANo

19

4

TPS7H6005165Ho

75

6.18 × 104

1 × 107

EN

14

14

IIMENSW500kHz

No

20

4

TPS7H6005165Ho756.09 × 1041 × 107EN1414IIMENSTN/ANo
21

4

TPS7H6005165Ho756.14 × 1041 × 107EN1414IIMENSTN/ANo

22

4

TPS7H6005165Ho756.26 × 1041 × 107DIS1414IIMENSTN/ANo

23

6

TPS7H6005165Ho757.25 × 1041 × 107EN1414IIMDISSW500kHzNo

24

6

TPS7H6005165Ho755.68 × 1041 × 107EN1414IIMDISSTN/ANo

25

6

TPS7H6005165Ho756.03 × 1041 × 107EN1414IIMDISSTN/ANo

26

6

TPS7H6005165Ho

75

7.1 × 104

1 × 107

DIS

14

14

IIMDISSTN/A

No

27

10

TPS7H6015165Ho758 × 1041 × 107EN1414PWM500kHzNo

28

10

TPS7H6015165Ho757.65 × 1041 × 107DIS1414PWMN/ANo

29

11

TPS7H6015165Ho756.38 × 1041 × 107EN1414IIMENSW500kHzNo

30

12

TPS7H6015165Ho757.17 × 1041 × 107EN1414IIMDISSW500kHzNo

31

13

TPS7H6025165Ho756.63 × 1041 × 107EN1414PWM500kHzNo

32

13

TPS7H6025165Ho756.21 × 1041 × 107DIS1414PWMN/ANo

33

14

TPS7H6025165Ho756.86 × 1041 × 107EN1414IIMENSW500kHzNo

34

14TPS7H6025165Ho755.95 × 1041 × 107

EN

1414IIMDISSW500kHzNo

Using the MFTF method described in Single-Event Effects (SEE) Confidence Interval Calculations, the upper-bound cross-section (using a 95% confidence level) is calculated as:

Equation 2. σSEB≤ 1.84 x 10-8 cm2/device for LETEFF = 75 MeV·cm2/mg and T = 25°C
SEB On Run 15 (PWM Mode, fsw = 500kHz)Figure 7-6 SEB On Run 15 (PWM Mode, fsw = 500kHz)
SEB Off Run 18 (PWM Mode)Figure 7-7 SEB Off Run 18 (PWM Mode)
SEB On Run 20 (IIM-Enabled Mode, EN/HI = 14V)Figure 7-8 SEB On Run 20 (IIM-Enabled Mode, EN/HI = 14V)
SEB Off Run 22 (IIM-Enabled Mode)Figure 7-9 SEB Off Run 22 (IIM-Enabled Mode)
SEB On Run 25 (IIM-Disabled Mode, PWM/LI = 14V)Figure 7-10 SEB On Run 25 (IIM-Disabled Mode, PWM/LI = 14V)
SEB Off Run 26 (IIM-Disabled Mode)Figure 7-11 SEB Off Run 26 (IIM-Disabled Mode)