SLVK075A May   2022  – April 2025 DP83561-SP

 

  1.   1
  2.   Single-Event Effects Test Report of the DP83561-SP Space grade (QMLV-RHA) 10/100/1000 Ethernet PHY
  3.   Trademarks
  4. 1Introduction
  5. 2Single-Event Effects
  6. 3Test Device and Evaluation Board Information
    1.     7
  7. 4Irradiation Facility and Setup
  8. 5Depth, Range, and LETEFF Calculation
  9. 6Test Setup and Procedures
  10. 7Single Event Effects (SEE)
    1. 7.1 Single-Event-Latchup (SEL)
    2. 7.2 Single Event Transients (SET)
  11. 8Summary
  12.   A References
  13.   B Revision History

7.2 Single Event Transients (SET)

SET testing was performed at room temperature, at three different LETeff levels, 8MeV, 48MeV, and 85MeV. With 197Au ions at an angle of 0° of incidence for an LETEFF of 85MeV × cm2/ mg .129Xe ions at angle of 0° of incidence were used for an LETEFF of 48 MeV × cm2/ mg. Also,40Ar ions at angle of 39.4° of incidence was used for an LETEFF of 8MeV × cm2/ mg, (see Table 5-1). For the SET testing, no external temperature force element was used during the characterization, the ambient temperature was set to 25°C.

Flux of approximately 104 ions/cm2·s and fluence ≥ 1× 106 ions/cm2 were used in each run. SETs were captured by monitoring.

Table 7-2 Summary of DP83561-SP SET Results Across MeV Levels
TEMP (°C) ION ANGLE OF INCIDENCE (°) LETEFF (MeV·cm2/mg) FLUX (IONS/CM2·s) FLUENCE (IONS/CM2) MAC - MDI CONFIGURATION CURRENT (mA) BEST CASE BER RATE Link Loss X-SEC PLL _X-SEC
VDD1P1 (1.21) VDD1P8 (1.89) VDDA2P5 (2.62) VDDIO (3.45)
25 Au 0 85 1.00×102 1.00×106 RGMII - 1G 146.1 56.1 92.1 58 2.488E-08 4.99E-05 4.99E-05

25

 Xe 0 48 1.00×102 1.00×106 RGMII - 1G 146 57 96.5 64 5.14487E-07 1.16E-05 1.16E-05
25 Ar 39.4 8 1.00×102 1.00×106 RGMII - 1G 146.4 55.8 91.8 58 2.846E-08 9.85E-06 9.85E-06

By monitoring extras signals on the scope cards, the different SET signatures were isolated and individual cross sections were created for each one. The trigger type and value used for each signal is described in Table 7-3.

Figure 7-5 through Figure 7-6 are plots of the SET cross sections vs. LET for the BER, link losses and PLL lock. Two sigma error bars, representing a confidence level of approximately 95% are plotted around each data point. A Weibull plot has been fitted to the data in Equation 1 (7) with the fit parameters listed in Table X-X. Events were seen at the lowest LET tested (8 MeV-cm2/mg) and 8 MeV-cm2/mg was used for the threshold LET. The cross sections at the highest LETeff tested (85 MeV-cm2/mg) were used for the limiting cross sections.

DP83561-SP
Table 7-3 Weibull Fit Parameters
Weibull Fit Paramenters
A Lo W s
RGMII 1-G BER 2.20E-04 8 25 1.2
RGMII 1-G Link Loss 4.99E-05 8 25 0.9
RGMII 1-G PLL Lock 4.99E-05 8 25 0.9
DP83561-SP SET Cross Section vs. LETeff for BER in RGMII-1G Mode with a Weibull Plot Fitted to the Data Figure 7-5 SET Cross Section vs. LETeff for BER in RGMII-1G Mode with a Weibull Plot Fitted to the Data
DP83561-SP SET Cross Section vs. LETeff for Link in RGMII-1G Mode with a Weibull Plot Fitted to the Data Figure 7-6 SET Cross Section vs. LETeff for Link in RGMII-1G Mode with a Weibull Plot Fitted to the Data
DP83561-SP SET Cross Section vs. LETeff for PLL Lock in RGMII-1G Mode with a Weibull Plot Fitted to the Data Figure 7-7 SET Cross Section vs. LETeff for PLL Lock in RGMII-1G Mode with a Weibull Plot Fitted to the Data