SBOK086 December   2024 TRF0208-SEP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1 Overview
  5. 2 Single-Event Effects
  6. 3 Test Device and Evaluation Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Set-Up and Procedures
  10. 7 Single-Event Latch-up (SEL) Results
  11. 8 Single-Event Transients (SET) Results
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A Total Ionizing Dose from SEE Experiments
  15.   B Confidence Interval Calculations
  16.   C References

10 Summary

The purpose of this study was to characterize the effect of heavy-ion irradiation on the single-event effect (SEE) performance of the TRF0208-SEP 11GHz, fully differential, ADC driver RF amplifier. Extensive SEE testing with heavy-ions having LETEFF from 9.62 to 56.1MeV-cm2/mg were conducted with heavy-ion fluences ranging from 106 to 107 ions/cm2 per run, at two different voltages and input conditions. The SEE results demonstrated that the TRF0208-SEP is SEL-free up to LETEFF = 56.1MeV-cm2/mg. CREME96-based worst-week event-rate calculations for LEO (ISS) and GEO orbits clearly demonstrate the robustness of the TRF0208-SEP in two harshly conservative space environments.