SBOK086 December   2024 TRF0208-SEP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1 Overview
  5. 2 Single-Event Effects
  6. 3 Test Device and Evaluation Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Set-Up and Procedures
  10. 7 Single-Event Latch-up (SEL) Results
  11. 8 Single-Event Transients (SET) Results
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A Total Ionizing Dose from SEE Experiments
  15.   B Confidence Interval Calculations
  16.   C References

3 Test Device and Evaluation Board Information

The TRF0208-SEP is packaged in a 12-pin RPV, WQFN - Flip Chip RLF (WQFN-FCRLF, 12) package as shown in Figure 3-1. The TRF0208SEP-EVM evaluation board (EVM) was used to evaluate the single-events-effects (SEE) of the TRF0208-SEP. Top and bottom views of the evaluation board used for the radiation testing are shown in Figure 3-2. Schematic of the evaluation board used for radiation testing is shown in Figure 3-3. For more technical information about the TRF0208-SEP, see https://www.ti.com/product/TRF0208-SEP/technicaldocuments.

Decapped TRF0208-SEP (Left) and Device Pin Out (Right)Figure 3-1 Decapped TRF0208-SEP (Left) and Device Pin Out (Right)
TRF0208SEP-EVM Board Top View (Left) and Bottom View (Right)Figure 3-2 TRF0208SEP-EVM Board Top View (Left) and Bottom View (Right)
TRF0208SEP-EVM, Evaluation Module Board Schematic for SEE TestingFigure 3-3 TRF0208SEP-EVM, Evaluation Module Board Schematic for SEE Testing