SBOK045 March   2024 INA901-SP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2Single-Event Effects (SEE)
  6. 3Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Test Setup and Procedures
  9. 6Destructive Single-Event Effects (DSEE)
    1. 6.1 Single-Event Latch-up (SEL) Results
  10. 7Single-Event Transients (SET)
  11. 8Event Rate Calculations
  12. 9Summary
  13.   A References

6.1 Single-Event Latch-up (SEL) Results

During SEL characterization, the device was heated using forced hot air, maintaining the die temperature at 125°C. The ion used for the SEL testing was Ho(165Ho) with an angle of incidence of 0° and 35° for an LETEFF = 76 and 93MeV-cm2 / mg, respectively. A flux of approximately 105 ions / cm2-s and a fluence of approximately 107 ions were used for all five runs. Run duration to achieve this fluence was approximately 120 seconds. The common mode voltage was set to the recommended maximum at 65V with a supply voltage of 16V. No SEL events were observed during all seven runs shown in Table 7-2. Figure 6-1 shows a typical plot of the current versus time.

Table 6-1 INA901-SP SEL Conditions Using165Ho With Angle-of-Incidence = 0° and 35°
Run Number Distance
(mm)		 Temperature
(°C)		 Ion Angle FLUX
(ions × cm2 / mg)		 Fluence
(Number of ions)		 LETEFF
(MeV × cm2/ mg)
3 40 125 Ho 0° 1.00E+05 1.00e+07 76
4 40 125 Ho 0° 1.00E+05 1.00E+07 76
6 40 125 Ho 35° 1.00E+05 1.00E+07 93
10 40 125 Ho 35° 1.00E+05 1.00E+07 93
11 40 125 Ho 35° 1.00E+05 1.00E+07 93

No SEL events were observed, indicating that the INA901-SP is SEL-immune at LETEFF = 93MeV-cm2 / mg and T = 125°C.

GUID-20240125-SS0I-JXV9-56JW-VG91CVPX1SZZ-low.svg Figure 6-1 Current vs Time (I vs t) Plot for VIN Supply Current During SEL Run 11