SBOK045 March   2024 INA901-SP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2Single-Event Effects (SEE)
  6. 3Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Test Setup and Procedures
  9. 6Destructive Single-Event Effects (DSEE)
    1. 6.1 Single-Event Latch-up (SEL) Results
  10. 7Single-Event Transients (SET)
  11. 8Event Rate Calculations
  12. 9Summary
  13.   A References

5 Test Setup and Procedures

SEE testing was performed on a INA901-SP device mounted on a INA901EVM-CVAL.

For SEL testing, the device was powered up to the maximum recommended common mode voltage of 65V and a supply voltage of 16V.

For the SET characterization, the device was powered up to 12V, characterized over three common mode voltages - 12V, 15V, and 48V. A differential voltage of 300mV was applied between the IN- and IN+ pins to set the output at 6V (half the supply voltage). The SET events were monitored using one National Instruments™ (NI) PXIe-5172 scope card. The scope was used to monitor and trigger from OUT, using a window trigger at approximately 6V ±180mV (±3%) from the top of the noise floor.

All equipment was controlled and monitored using a custom-developed LabVIEW™ program (PXI-RadTest) running on a HP-Z4® desktop computer. The computer communicates with the PXI chassis through an MXI controller and NI PXIe-8381 remote control module.

Figure 5-1 shows a block diagram of the setup used for SEE testing of the INA901-SP. Table 5-1 lists the connections, limits, and compliance values used during the testing. A die temperature of 125°C was used for SEL and was achieved with the use of a convection heat gun aimed at the die. For SET testing, the device was tested at room temperature No cooling or heating was applied to the DUT.

Table 5-1 Equipment Set and Parameters Used for SEE Testing the INA901-SP
Connection NameEquipment UsedCapabilityComplianceRange of Values Used
VCMNI-PXIe 4137 PS 15A10A12V, 15V, 48V, 65V
VDIFFNI-PXIe 4145 PS 15A10A300mV
OUTNI-PXIe 5172 Digitizer Scope (Channel 0)100MS / s—2MS / s
V+NI-PXIe 4139 PS 15A10A12V, 16V

All boards used for SEE testing were fully checked for functionality. Dry runs were also performed to make sure that the test system was stable under all bias and load conditions prior to being taken to the TAMU facility. During the heavy-ion testing, the LabVIEW control program powered up the INA901-SP device and set the external sourcing and monitoring functions of the external equipment. After functionality and stability was confirmed, the beam shutter was opened to expose the device to the heavy-ion beam. The shutter remained open until the target fluence was achieved (determined by external detectors and counters). During irradiation, the NI scope card continuously monitored the signals. When the output voltage exceeded 6V ±180mV (VOUTNOM ±3%) window trigger, a data capture was initiated. In addition to monitoring the voltage levels of the scope, the VS current was monitored at all times. No sudden increases in current were observed (outside of normal fluctuations) on any of the test runs and indicated that no SEL events occurred during any of the tests.

GUID-20240125-SS0I-B3PH-4GNC-BT6RKQRQ5PRX-low.svgFigure 5-1 Block Diagram of SEE Test Setup with the INA901-SP