SBOK045 March   2024 INA901-SP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2Single-Event Effects (SEE)
  6. 3Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Test Setup and Procedures
  9. 6Destructive Single-Event Effects (DSEE)
    1. 6.1 Single-Event Latch-up (SEL) Results
  10. 7Single-Event Transients (SET)
  11. 8Event Rate Calculations
  12. 9Summary
  13.   A References

Abstract

The purpose of this study was to characterize the effects of heavy-ion irradiation on the single-event latchup (SEL) performance of the INA901-SP, 65V, low-high-side, high-speed, voltage output current sense amplifier. Heavy ions with an LETEFF of 76 to 93MeV-cm2/ mg were used to irradiate one device with a fluence of 1 × 107 ions / cm2. The results demonstrate that the INA901-SP is SEL-free up to LETEFF = 93MeV-cm2 / mg at 125°C.