SBAK042 January   2026 DAC39RF10-SP , DAC39RFS10-SP

 

  1.   1
  2.   DAC39RFx10-SP Total Ionizing Dose (TID) Radiation Report
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Device Details
  5. 2TID Test Setup
    1. 2.1 Test Methodology
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Biasing Conditions
    4. 2.4 Exposure Details
  6. 3TID Characterization Test Results
  7.   A TID Data Plots

Abstract

This report covers the radiation characterization results of the DAC39RF10-SP Radiation 16-Bit Multi-Nyquist Digital-to-Analog Converter (DAC). The study was done to determine Total Ionizing Dose (TID) effects under high dose rate (HDR) up to 450 krad(Si) as a one time characterization. The results show that all samples passed within the specified limits up to 450 krad(Si).

To ensure the following results, the Radiation Lot Acceptance Testing (RLAT) was performed using 5 units at a dose level of 300 krad(Si).

Additionally, the DAC39RF10-SP is Single Event Latch-Up (SEL) immune up to 120MeV-cm2/mg.