ZHCSAY5D march 2013 – april 2021 UCD3138064
PRODUCTION DATA
| PARAMETER | TEST CONDITION | MIN | TYP | MAX | UNIT | |
|---|---|---|---|---|---|---|
| SUPPLY CURRENT | ||||||
| I33A | Measured on V33A. The device is powered up but all ADC12 and EADC sampling is disabled | 6.3 | mA | |||
| I33DIO | All GPIO and communication pins are open | 0.35 | mA | |||
| I33D | ROM program execution | 60 | mA | |||
| I33D (5) | Flash programming in ROM mode | 70 | mA | |||
| I33 | The device is in ROM mode with all DPWMs enabled and switching at 2 MHz. The DPWMs are all unloaded. | 100 | mA | |||
| ERROR ADC INPUTS EAP, EAN | ||||||
| EAP – AGND | –0.15 | 1.998 | V | |||
| EAP – EAN | –0.256 | 1.848 | V | |||
| Typical error range | AFE = 0 | –256 | 248 | mV | ||
| EAP – EAN Error voltage digital resolution | AFE = 3 | 0.8 | 1 | 1.20 | mV | |
| AFE = 2 | 1.7 | 2 | 2.30 | mV | ||
| AFE = 1 | 3.55 | 4 | 4.45 | mV | ||
| AFE = 0 | 6.90 | 8 | 9.10 | mV | ||
| REA | Input impedance (See Figure 9-1) | AGND reference | 0.5 | MΩ | ||
| IOFFSET | Input offset current (See Figure 9-1) | –5 | 5 | μA | ||
| EADC Offset | Input voltage = 0 V at AFE = 0 | –2 | 2 | LSB | ||
| Input voltage = 0 V at AFE = 1 | –2.5 | 2.5 | LSB | |||
| Input voltage = 0 V at AFE = 2 | –3 | -3 | LSB | |||
| Input voltage = 0 V at AFE = 3 | –4 | 4 | LSB | |||
| Sample Rate | 15.625 | MHz | ||||
| Analog Front End Amplifier Bandwidth | 100 | MHz | ||||
| A0 | Gain | See Figure 9-2 | 1 | V/V | ||
| Minimum output voltage | 21 | mV | ||||
| EADC DAC | ||||||
| DAC range | 0 | 1.6 | V | |||
| VREF DAC reference resolution | 10-bit, No dithering enabled | 1.56 | mV | |||
| VREF DAC reference resolution | With 4-bit dithering enabled | 97.6 | μV | |||
| INL | –2.0 | 2.0 | LSB | |||
| DNL | Does not include MSB transition | –1.0 | 2.1 | LSB | ||
| DNL at MSB transition | –1.4 | LSB | ||||
| DAC reference voltage | 1.58 | 1.61 | V | |||
| ADC12 | ||||||
| IBIAS | Bias current for PMBus address pins | 9.5 | 10.5 | μA | ||
| Measurement range for voltage monitoring | 0 | 2.5 | V | |||
| Internal ADC reference voltage | –40 to 125 °C | 2.475 | 2.500 | 2.53 | V | |
| Change in Internal ADC reference from 25°C reference voltage (5) | –40 to 25 °C | –0.7 | mV | |||
| 25 to 125 °C | –2.1 | |||||
| ADC12 INL integral nonlinearity (5) | ADC_SAMPLING_SEL = 6 for all ADC12 data, 25 to 125 °C | –7.5/+2.9 | LSB | |||
| ADC12 DNL differential nonlinearity (5) | –0.7/+3.2 | LSB | ||||
| ADC Zero Scale Error | –7 | 7 | mV | |||
| ADC Full Scale Error | –35 | 35 | mV | |||
| Input bias | 2.5 V applied to pin | 200 | nA | |||
| Input leakage resistance (5) | ADC_SAMPLING_SEL= 6 or 0 | 1 | MΩ | |||
| Input Capacitance (5) | 10 | pF | ||||
| DIGITAL INPUTS/OUTPUTS(1)(2) | ||||||
| VOL | Low-level output voltage(3) | IOH = 4 mA, V33DIO = 3 V | DGND + 0.25 | V | ||
| VOH | High-level output voltage (3) | IOH = –4 mA, V33DIO = 3 V | V33DIO – 0.6 | V | ||
| VIH | High-level input voltage | V33DIO = 3 V | 2.1 | V | ||
| VIL | Low-level input voltage | V33DIO = 3 V | 1.1 | V | ||
| IOH | Output sinking current | 4 | mA | |||
| IOL | Output sourcing current | –4 | mA | |||
| SYSTEM PERFORMANCE | ||||||
| TWD | Watchdog time out resolution | Total time is: TWD x (WDCTRL.PERIOD+1) | 13.1 | 17 | 22.7 | ms |
| Processor master clock (MCLK) | 31.25 | MHz | ||||
| tDelay | Digital filter delay(4) | (1 clock = 32 ns) | 6 | MCLKs | ||
| Retention period of flash content (data retention and program) | TJ = 25 °C | 100 | years | |||
| f(PCLK) | Internal oscillator frequency | 240 | 250 | 260 | MHz | |
| Flash Read | 1 | MCLKs | ||||
| ISHARE | Current share current source (See Section 9.3.15) | 238 | 259 | μA | ||
| RSHARE | Current share resistor (See Section 9.3.15) | 9.75 | 10.3 | kΩ | ||
| POWER ON RESET AND BROWN OUT (V33A pin, See Figure 8-3) | ||||||
| VGH | Voltage Good High | 2.7 | V | |||
| VGL | Voltage Good Low | 2.5 | V | |||
| Vres | Voltage at which IReset signal is valid(5) | 0.8 | V | |||
| Brownout | Internal signal warning of brownout conditions | 2.9 | V | |||
| TEMPERATURE SENSOR(5) | ||||||
| VTEMP | Voltage range of sensor | 1.46 | 2.44 | V | ||
| Voltage resolution | Volts/°C | 5.9 | mV/°C | |||
| Temperature resolution | Degree C per bit | 0.1034 | °C/LSB | |||
| Accuracy(5)(6) | –40 to 125 °C | –10 | ±5 | 10 | °C | |
| Temperature range | –40 to 125 °C | –40 | 125 | °C | ||
| ITEMP | Current draw of sensor when active | 30 | μA | |||
| VAMB | Ambient temperature | Trimmed 25 °C reading | 1.85 | V | ||
| ANALOG COMPARATOR | ||||||
| DAC | Reference DAC Range | 0 | 2.5 | V | ||
| Reference Voltage | 2.478 | 2.5 | 2.513 | V | ||
| Bits | 7 | bits | ||||
| INL(5) | –0.42 | 0.21 | LSB | |||
| DNL(5) | 0.06 | 0.12 | LSB | |||
| Offset | –5.5 | 19.5 | mV | |||
| Reference DAC buffered output load(7) | –0.5 | 1 | mA | |||
| Buffer offset (–0.5 mA) | 4.6 | 8.3 | mV | |||
| Buffer offset (1.0 mA) | –0.05 | 17 | mV | |||
| Output Range (–0.5 mA) | 0.2 | 2.5 | V | |||
| Output Range (1.0 mA) | 0 | 2.5 | V | |||