ZHCSJ32C
December 2018 – September 2020
SN74AXCH1T45
PRODUCTION DATA
1
特性
2
应用
3
说明
4
Revision History
5
Pin Configuration and Functions
6
Specifications
6.1
Absolute Maximum Ratings
6.2
ESD Ratings
6.3
Recommended Operating Conditions
6.4
Thermal Information
6.5
Electrical Characteristics
6.6
Operating Characteristics: TA = 25°C
6.7
Typical Characteristics
7
Parameter Measurement Information
7.1
Load Circuit and Voltage Waveforms
8
Detailed Description
8.1
Overview
8.2
Functional Block Diagram
8.3
Feature Description
8.3.1
Standard CMOS Inputs
8.3.2
Balanced High-Drive CMOS Push-Pull Outputs
8.3.3
Partial Power Down (Ioff)
8.3.4
VCC Isolation
8.3.5
Over-voltage Tolerant Inputs
8.3.6
Negative Clamping Diodes
8.3.7
Fully Configurable Dual-Rail Design
8.3.8
Supports High-Speed Translation
8.3.9
Bus-Hold Data Inputs
8.4
Device Functional Modes
9
Application and Implementation
9.1
Application Information
9.1.1
Enable Times
9.2
Typical Applications
9.2.1
Interrupt Request Application
9.2.1.1
Design Requirements
9.2.1.2
Detailed Design Procedure
9.2.1.3
Application Curve
9.2.2
Universal Asynchronous Receiver-Transmitter (UART) Interface Application
9.2.2.1
Design Requirements
9.2.2.2
Detailed Design Procedure
10
Power Supply Recommendations
11
Layout
11.1
Layout Guidelines
11.2
Layout Example
12
Device and Documentation Support
12.1
Documentation Support
12.2
接收文档更新通知
12.3
支持资源
12.4
Trademarks
12.5
静电放电警告
12.6
术语表
13
Mechanical, Packaging, and Orderable Information
封装选项
机械数据 (封装 | 引脚)
DRY|6
MPDS221F
DCK|6
MPDS114C
DTQ|6
MUSS003
DBV|6
MPDS026O
散热焊盘机械数据 (封装 | 引脚)
DRY|6
QFND138E
DCK|6
QFND228B
订购信息
zhcsj32c_oa
zhcsj32c_pm
12.5
静电放电警告
静电放电 (ESD) 会损坏这个集成电路。德州仪器 (TI) 建议通过适当的预防措施处理所有集成电路。如果不遵守正确的处理和安装程序,可能会损坏集成电路。
ESD 的损坏小至导致微小的性能降级,大至整个器件故障。精密的集成电路可能更容易受到损坏,这是因为非常细微的参数更改都可能会导致器件与其发布的规格不相符。