ZHCSE69E November   2014  – May 2025 DLP9500UV

PRODUCTION DATA  

  1.   1
  2. 1 特性
  3. 2 应用
  4. 3 说明
  5. 4 说明（续）
  6. 5 Pin Configuration and Functions
    1.     Pin Functions
  7. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  Storage Conditions
    3. 6.3  ESD Ratings
    4. 6.4  Recommended Operating Conditions
    5. 6.5  Thermal Information
    6. 6.6  Electrical Characteristics
    7. 6.7  LVDS Timing Requirements
    8. 6.8  LVDS Waveform Requirements
    9. 6.9  Serial Control Bus Timing Requirements
    10. 6.10 Systems Mounting Interface Loads
    11. 6.11 Micromirror Array Physical Characteristics
    12. 6.12 Micromirror Array Optical Characteristics
    13. 6.13 Chipset Component Usage Specification
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 DLPC410—Digital Controller for DLP Discovery 4100 Chipset
      2. 7.3.2 DLPA200 - DMD Micromirror Drivers
      3. 7.3.3 DLPR410—PROM for DLP Discovery 4100 Chipset
      4. 7.3.4 DLP9500—DLP 0.95 1080p 2xLVDS UV Type-A DMD 1080p DMD
        1. 7.3.4.1 DLP9500UV 1080p Chipset Interfaces
          1. 7.3.4.1.1 DLPC410 Interface Description
            1. 7.3.4.1.1.1 DLPC410 IO
            2. 7.3.4.1.1.2 Initialization
            3. 7.3.4.1.1.3 DMD Device Detection
            4. 7.3.4.1.1.4 Power Down
          2. 7.3.4.1.2 DLPC410 to DMD Interface
            1. 7.3.4.1.2.1 DLPC410 to DMD IO Description
            2. 7.3.4.1.2.2 Data Flow
          3. 7.3.4.1.3 DLPC410 to DLPA200 Interface
            1. 7.3.4.1.3.1 DLPA200 Operation
            2. 7.3.4.1.3.2 DLPC410 to DLPA200 IO Description
          4. 7.3.4.1.4 DLPA200 to DLP9500UV Interface
            1. 7.3.4.1.4.1 DLPA200 to DLP9500UV Interface Overview
      5. 7.3.5 Measurement Conditions
    4. 7.4 Device Functional Modes
      1. 7.4.1 Single Block Mode
      2. 7.4.2 Dual Block Mode
      3. 7.4.3 Quad Block Mode
      4. 7.4.4 Global Block Mode
    5. 7.5 Window Characteristics and Optics
      1. 7.5.1 Optical Interface and System Image Quality
      2. 7.5.2 Numerical Aperture and Stray Light Control
      3. 7.5.3 Pupil Match
      4. 7.5.4 Illumination Overfill
    6. 7.6 Micromirror Array Temperature Calculation
      1. 7.6.1 Package Thermal Resistance
      2. 7.6.2 Case Temperature
      3. 7.6.3 Micromirror Array Temperature Calculation
    7. 7.7 Micromirror Landed-On and Landed-Off Duty Cycle
      1. 7.7.1 Definition of Micromirror Landed-On/Landed-Off Duty Cycle
      2. 7.7.2 Landed Duty Cycle and Useful Life of the DMD
      3. 7.7.3 Landed Duty Cycle and Operational DMD Temperature
      4. 7.7.4 Estimating the Long-Term Average Landed Duty Cycle of a Product or Application
  9. 8 Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 DMD Reflectivity Characteristics
        1. 8.1.1.1 Design Considerations Influencing DMD Reflectivity
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
        1. 8.2.1.1 Device Description
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curve
    3. 8.3 Power Supply Recommendations
      1. 8.3.1 Power-Up Sequence (Handled by the DLPC410)
      2. 8.3.2 DMD Power-Up and Power-Down Procedures
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
        1. 8.4.1.1 Impedance Requirements
        2. 8.4.1.2 PCB Signal Routing
        3. 8.4.1.3 Fiducials
        4. 8.4.1.4 PCB Layout Guidelines
          1. 8.4.1.4.1 DMD Interface
            1. 8.4.1.4.1.1 Trace Length Matching
          2. 8.4.1.4.2 DLP9500UV Decoupling
            1. 8.4.1.4.2.1 Decoupling Capacitors
          3. 8.4.1.4.3 VCC and VCC2
          4. 8.4.1.4.4 DMD Layout
          5. 8.4.1.4.5 DLPA200
      2. 8.4.2 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Device Support
      1. 9.1.1 Device Nomenclature
      2. 9.1.2 Device Marking
    2. 9.2 Documentation Support
      1. 9.2.1 Related Documentation
    3. 9.3 Related Links
    4. 9.4 支持资源
    5. 9.5 Trademarks
    6. 9.6 静电放电警告
    7. 9.7 术语表
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

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8.1.1 DMD Reflectivity Characteristics

TI assumes no responsibility for end-equipment reflectivity performance. Achieving the desired end-equipment reflectivity performance involves making trade-offs between numerous component and system design parameters. Typical DMD reflectivity characteristics over UV exposure times are represented in Figure 8-1.

DLP9500UV Nominal DMD Relative Reflectivity Percentage vs Total Exposure Hours
2.3 W/cm2, 363 to 400nm, 25°C
Figure 8-1 Nominal DMD Relative Reflectivity Percentage vs Total Exposure Hours

DMD reflectivity includes micromirror surface reflectivity and window transmission. The DMD was characterized for DMD reflectivity using a broadband light source (200W metal-halide lamp). Data is based on a 2.3W/cm2 UV exposure at the DMD surface (365nm peak output) using a 363nm high-pass filter between the light source and the DMD. (Contact your local Texas Instruments representative for additional information about power density measurements and UV filter details.)