SLASF44 may   2023 AFE78201 , AFE88201

PRODUCTION DATA  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
  6. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Electrical Characteristics
    6. 6.6  Timing Requirements
    7. 6.7  Timing Diagrams
    8. 6.8  Typical Characteristics: VOUT DAC
    9. 6.9  Typical Characteristics: ADC
    10. 6.10 Typical Characteristics: Reference
    11. 6.11 Typical Characteristics: Power Supply
  7. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1  Digital-to-Analog Converter (DAC) Overview
        1. 7.3.1.1 DAC Resistor String
        2. 7.3.1.2 DAC Buffer Amplifier
        3. 7.3.1.3 DAC Transfer Function
        4. 7.3.1.4 DAC Gain and Offset Calibration
        5. 7.3.1.5 Programmable Slew Rate
        6. 7.3.1.6 DAC Register Structure and CLEAR State
      2. 7.3.2  Analog-to-Digital Converter (ADC) Overview
        1. 7.3.2.1 ADC Operation
        2. 7.3.2.2 ADC Custom Channel Sequencer
        3. 7.3.2.3 ADC Synchronization
        4. 7.3.2.4 ADC Offset Calibration
        5. 7.3.2.5 External Monitoring Inputs
        6. 7.3.2.6 Temperature Sensor
        7. 7.3.2.7 Self-Diagnostic Multiplexer
        8. 7.3.2.8 ADC Bypass
      3. 7.3.3  Programmable Out-of-Range Alarms
        1. 7.3.3.1 Alarm-Based Interrupts
        2. 7.3.3.2 Alarm Action Configuration Register
        3. 7.3.3.3 Alarm Voltage Generator
        4. 7.3.3.4 Temperature Sensor Alarm Function
        5. 7.3.3.5 Internal Reference Alarm Function
        6. 7.3.3.6 ADC Alarm Function
        7. 7.3.3.7 Fault Detection
      4. 7.3.4  IRQ
      5. 7.3.5  Internal Reference
      6. 7.3.6  Integrated Precision Oscillator
      7. 7.3.7  Precision Oscillator Diagnostics
      8. 7.3.8  One-Time Programmable (OTP) Memory
      9. 7.3.9  GPIO
      10. 7.3.10 Timer
      11. 7.3.11 Unique Chip Identifier (ID)
      12. 7.3.12 Scratch Pad Register
    4. 7.4 Device Functional Modes
      1. 7.4.1 Register Built-In Self-Test (RBIST)
      2. 7.4.2 DAC Power-Down Mode
      3. 7.4.3 Reset
    5. 7.5 Programming
      1. 7.5.1 Communication Setup
        1. 7.5.1.1 SPI Mode
        2. 7.5.1.2 UART Mode
      2. 7.5.2 GPIO Programming
      3. 7.5.3 Serial Peripheral Interface (SPI)
        1. 7.5.3.1 SPI Frame Definition
        2. 7.5.3.2 SPI Read and Write
        3. 7.5.3.3 Frame Error Checking
        4. 7.5.3.4 Synchronization
      4. 7.5.4 UART Interface
        1. 7.5.4.1 UART Break Mode (UBM)
      5. 7.5.5 Status Bits
      6. 7.5.6 Watchdog Timer
    6. 7.6 Register Maps
      1. 7.6.1 AFEx8201 Registers
  8. 8 Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Multichannel Configuration
    2. 8.2 Typical Application
      1. 8.2.1 Analog Output Module
        1. 8.2.1.1 Design Requirements
        2. 8.2.1.2 Detailed Design Procedure
          1. 8.2.1.2.1 XTR305
            1. 8.2.1.2.1.1 Current-Output Mode
            2. 8.2.1.2.1.2 Voltage Output Mode
            3. 8.2.1.2.1.3 Diagnostic Features
        3. 8.2.1.3 Application Curves
    3. 8.3 Initialization Setup
    4. 8.4 Power Supply Recommendations
    5. 8.5 Layout
      1. 8.5.1 Layout Guidelines
      2. 8.5.2 Layout Example
  9. 9 Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Related Documentation
    2. 9.2 Receiving Notification of Documentation Updates
    3. 9.3 Support Resources
    4. 9.4 Trademarks
    5. 9.5 Electrostatic Discharge Caution
    6. 9.6 Glossary
  10. 10Mechanical, Packaging, and Orderable Information

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8.2.1.2.1.3 Diagnostic Features

In addition to the diagnostic ADC and alarms of the AFEx8201 described in Section 7.3.2 and Section 7.3.3.6, the XTR305 has several additional diagnostic features.

IA Common-Mode Overvoltage Range (EFCM): This flag goes low as soon as the input of the IA reach the limits of the linear operation for the input voltage.

Overtemperature Flag (EFOT): This flag goes low if the chip temperature reaches 140°C and resets as soon as the temperature cools down to less than 125°C.

Load Error (EFLD): Indicates fault conditions driving voltage or current into the load. In voltage-output mode, the device monitors the voltage limits of the output swing and the current limit condition caused from short or low load resistance. In current-output mode, the alarm indicates a saturation into the supply rails from a high-load resistance or open load. The fault flag helps detect whether the analog output wire is broken or shorted. This feature improves the reliability of the analog output function. In case of a short-circuited load, the output current is limited to ±20 mA in voltage-output mode, and ±32 mA in the current-output mode.

All three fault flags are open collector, and therefore require pullup resistors.

Analog Output Monitor: In current-output mode, the IA output is connected to a resistor through the IAOUT pin and the IMON pin is internally disconnected. IAOUT is proportional to the output voltage given by Equation 18. This current is converted into voltage across a 500‑Ω resistor that can be sensed by the ADC on the AFEx8201. This current measurement enables a monitor of the output power delivered to the load. If the load resistance is known, then the output current can be calculated and compared with the commanded value.

Equation 18. I A O U T = 2 × V O U T R G A I N

During voltage-output mode, 1/10th of the output drive current is mirrored onto the IMON pin and IAOUT is internally disconnected. The IMON pin is connected to a 1-kΩ resistor. The voltage across this resistor is sensed by the ADC on the AFE88201. If the output load is known, then the output voltage can be calculated and compared with the commanded value. The output power delivered to the load can also be calculated. Output monitor functions help detect load changes enabling predictive maintenance, which increase reliability of the analog output function.