ZHCSEE1F October   2010  – September 2019 ADS1118

PRODUCTION DATA.  

  1. 1 特性
  2. 2 应用
  3. 3 说明
    1.     Device Images
      1.      K 型热电偶测量使用集成温度传感器进行冷结点补偿
  4. 4 修订历史记录
  5. 5 Device Comparison Table
  6. 6 Pin Configuration and Functions
    1.     Pin Functions
  7. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 Timing Requirements: Serial Interface
    7. 7.7 Switching Characteristics: Serial Interface
    8. 7.8 Typical Characteristics
  8. 8 Parameter Measurement Information
    1. 8.1 Noise Performance
  9. 9 Detailed Description
    1. 9.1 Overview
    2. 9.2 Functional Block Diagram
    3. 9.3 Feature Description
      1. 9.3.1 Multiplexer
      2. 9.3.2 Analog Inputs
      3. 9.3.3 Full-Scale Range (FSR) and LSB Size
      4. 9.3.4 Voltage Reference
      5. 9.3.5 Oscillator
      6. 9.3.6 Temperature Sensor
        1. 9.3.6.1 Converting from Temperature to Digital Codes
        2. 9.3.6.2 Converting from Digital Codes to Temperature
    4. 9.4 Device Functional Modes
      1. 9.4.1 Reset and Power Up
      2. 9.4.2 Operating Modes
        1. 9.4.2.1 Single-Shot Mode and Power-Down
        2. 9.4.2.2 Continuous-Conversion Mode
      3. 9.4.3 Duty Cycling for Low Power
    5. 9.5 Programming
      1. 9.5.1 Serial Interface
      2. 9.5.2 Chip Select (CS)
      3. 9.5.3 Serial Clock (SCLK)
      4. 9.5.4 Data Input (DIN)
      5. 9.5.5 Data Output and Data Ready (DOUT/DRDY)
      6. 9.5.6 Data Format
      7. 9.5.7 Data Retrieval
        1. 9.5.7.1 32-Bit Data Transmission Cycle
        2. 9.5.7.2 16-Bit Data Transmission Cycle
    6. 9.6 Register Maps
      1. 9.6.1 Conversion Register [reset = 0000h]
        1. Table 6. Conversion Register Field Descriptions
      2. 9.6.2 Config Register [reset = 058Bh]
        1. Table 7. Config Register Field Descriptions
  10. 10Application and Implementation
    1. 10.1 Application Information
      1. 10.1.1 Serial Interface Connections
      2. 10.1.2 GPIO Ports for Communication
      3. 10.1.3 Analog Input Filtering
      4. 10.1.4 Single-Ended Inputs
      5. 10.1.5 Connecting Multiple Devices
      6. 10.1.6 Pseudo Code Example
    2. 10.2 Typical Application
      1. 10.2.1 Design Requirements
      2. 10.2.2 Detailed Design Procedure
      3. 10.2.3 Application Curves
  11. 11Power Supply Recommendations
    1. 11.1 Power-Supply Sequencing
    2. 11.2 Power-Supply Decoupling
  12. 12Layout
    1. 12.1 Layout Guidelines
    2. 12.2 Layout Example
  13. 13器件和文档支持
    1. 13.1 文档支持
      1. 13.1.1 相关文档
    2. 13.2 接收文档更新通知
    3. 13.3 社区资源
    4. 13.4 商标
    5. 13.5 静电放电警告
    6. 13.6 Glossary
  14. 14机械、封装和可订购信息

封装选项

机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)
订购信息

8.1 Noise Performance

Delta-sigma (ΔΣ) analog-to-digital converters (ADCs) are based on the principle of oversampling. The input signal of a ΔΣ ADC is sampled at a high frequency (modulator frequency) and subsequently filtered and decimated in the digital domain to yield a conversion result at the respective output data rate. The ratio between modulator frequency and output data rate is called oversampling ratio (OSR). By increasing the OSR, and thus reducing the output data rate, the noise performance of the ADC can be optimized. In other words, the input-referred noise drops when reducing the output data rate because more samples of the internal modulator are averaged to yield one conversion result. Increasing the gain also reduces the input-referred noise, which is particularly useful when measuring low-level signals.

Table 1 and Table 2 summarize the device noise performance. Data are representative of typical noise performance at TA = 25°C with the inputs shorted together externally. Table 1 show the input-referred noise in units of μVRMS for the conditions shown. Note that µVPP values are shown in parenthesis. Table 2 shows the corresponding data in effective number of bits (ENOB) calculated from μVRMS values using Equation 1. The noise-free bits calculated from peak-to-peak noise values using Equation 2 are shown in parenthesis.

Equation 1. ENOB = ln (FSR / VRMS-Noise) / ln(2)
Equation 2. Noise-Free Bits = ln (FSR / VPP-Noise) / ln(2)

Table 1. Noise in μVRMS (μVPP) at VDD = 3.3 V

DATA RATE
(SPS)		 FSR (Full-Scale Range)
±6.144 V ±4.096 V ±2.048 V ±1.024 V ±0.512 V ±0.256 V
8 187.5 (187.5) 125 (125) 62.5 (62.5) 31.25 (31.25) 15.62 (15.62) 7.81 (7.81)
16 187.5 (187.5) 125 (125) 62.5 (62.5) 31.25 (31.25) 15.62 (15.62) 7.81 (7.81)
32 187.5 (187.5) 125 (125) 62.5 (62.5) 31.25 (31.25) 15.62 (15.62) 7.81 (7.81)
64 187.5 (187.5) 125 (125) 62.5 (62.5) 31.25 (31.25) 15.62 (15.62) 7.81 (7.81)
128 187.5 (187.5) 125 (125) 62.5 (62.5) 31.25 (31.25) 15.62 (15.62) 7.81 (12.35)
250 187.5 (252.09) 125 (148.28) 62.5 (84.03) 31.25 (39.54) 15.62 (16.06) 7.81 (18.53)
475 187.5 (266.92) 125 (227.38) 62.5 (79.08) 31.25 (56.84) 15.62 (32.13) 7.81 (25.95)
860 187.5 (430.06) 125 (266.93) 62.5 (118.63) 31.25 (64.26) 15.62 (40.78) 7.81 (35.83)

Table 2. ENOB from RMS Noise (Noise-Free Bits from Peak-to-Peak Noise) at VDD = 3.3 V

DATA RATE
(SPS)		 FSR (Full-Scale Range)
±6.144 V ±4.096 V ±2.048 V ±1.024 V ±0.512 V ±0.256 V
8 16 (16) 16 (16) 16 (16) 16 (16) 16 (16) 16 (16)
16 16 (16) 16 (16) 16 (16) 16 (16) 16 (16) 16 (16)
32 16 (16) 16 (16) 16 (16) 16 (16) 16 (16) 16 (16)
64 16 (16) 16 (16) 16 (16) 16 (16) 16 (16) 16 (16)
128 16 (16) 16 (16) 16 (16) 16 (16) 16 (16) 16 (15.33)
250 16 (15.57) 16 (15.75) 16 (15.57) 16 (15.66) 16 (15.96) 16 (14.75)
475 16 (15.49) 16 (15.13) 16 (15.66) 16 (15.13) 16 (14.95) 16 (14.26)
860 16 (14.8) 16 (14.9) 16 (15.07) 16 (14.95) 16 (14.61) 16 (13.8)