ZHCSKW7D October   2003  – February 2020 ADS1204

PRODUCTION DATA.  

  1. 特性
  2. 应用
  3. 说明
    1.     功能方框图
  4. 修订历史记录
  5. Pin Configuration and Functions
    1.     Pin Functions
  6. Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Timing Requirements: 5.0 V
    7. 6.7 Timing Requirements: 3.0 V
    8. 6.8 Typical Characteristics
  7. Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Analog Input Stage
        1. 7.3.1.1 Analog Input
        2. 7.3.1.2 Modulator
      2. 7.3.2 Digital Output
      3. 7.3.3 Equivalent Input Circuits
    4. 7.4 Device Functional Modes
  8. Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Filter Usage
  9. Power Supply Recommendations
    1. 9.1 Power-Supply Sequencing
    2. 9.2 Power-Supply Decoupling
  10. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  11. 11器件和文档支持
    1. 11.1 接收文档更新通知
    2. 11.2 支持资源
    3. 11.3 商标
    4. 11.4 静电放电警告
    5. 11.5 Glossary
  12. 12机械、封装和可订购信息

封装选项

机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)
订购信息

Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1)
MIN MAX UNIT
Supply voltage AVDD to AGND –0.3 6 V
BVDD to BGND –0.3 6
Analog input voltage with respect to AGND AGND – 0.3 AVDD + 0.3 V
Reference input voltage with respect to AGND AGND – 0.3 AVDD + 0.3 V
Digital input voltage with respect to BGND BGND – 0.3 BVDD + 0.3 V
Ground voltage difference, AGND to BGND ±0.3 V
Voltage differences, BVDD to AGND –0.3 6 V
Input current to any pin except supply ±10 mA
Power dissipation See the Thermal Information A
Temperature Operating virtual junction, TJ –40 +150 °C
Storage, Tstg –65 +150
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.