可提供此产品的更新版本
功能优于比较器件，可直接替换。
LF356
- Advantages
- Replace Expensive Hybrid and Module FET
Op Amps - Rugged JFETs Allow Blow-Out Free Handling
Compared With MOSFET Input Devices - Excellent for Low Noise Applications Using
Either High or Low Source Impedance–Very
Low 1/f Corner - Offset Adjust Does Not Degrade Drift or
Common-Mode Rejection as in Most
Monolithic Amplifiers - New Output Stage Allows Use of Large
Capacitive Loads (5,000 pF) Without Stability
Problems - Internal Compensation and Large Differential
Input Voltage Capability
- Replace Expensive Hybrid and Module FET
- Common Features
- Low Input Bias Current: 30 pA
- Low Input Offset Current: 3 pA
- High Input Impedance: 1012 Ω
- Low Input Noise Current: 0.01 pA/√Hz
- High Common-Mode Rejection Ratio: 100 dB
- Large DC Voltage Gain: 106 dB
- Uncommon Features
- Extremely Fast Settling Time to 0.01%:
- 4 µs for the LFx55 devices
- 1.5 µs for the LFx56
- 1.5 µs for the LFx57 (AV = 5)
- Fast Slew Rate:
- 5 V/µs for the LFx55
- 12 V/µs for the LFx56
- 50 V/µs for the LFx57 (AV = 5)
- Wide Gain Bandwidth:
- 2.5 MHz for the LFx55 devices
- 5 MHz for the LFx56
- 20 MHz for the LFx57 (AV = 5)
- Low Input Noise Voltage:
- 20 nV/√Hz for the LFx55
- 12 nV/√Hz for the LFx56
- 12 nV/√Hz for the LFx57 (AV = 5)
- Extremely Fast Settling Time to 0.01%:
The LFx5x devices are the first monolithic JFET input operational amplifiers to incorporate well-matched, high-voltage JFETs on the same chip with standard bipolar transistors (BI-FET™ Technology). These amplifiers feature low input bias and offset currents/low offset voltage and offset voltage drift, coupled with offset adjust, which does not degrade drift or common-mode rejection. The devices are also designed for high slew rate, wide bandwidth, extremely fast settling time, low voltage and current noise and a low 1/f noise corner.
技术文档
| 顶层文档 | 类型 | 标题 | 格式选项 | 下载最新的英语版本 | 日期 | |
|---|---|---|---|---|---|---|
| * | 数据表 | LFx5x JFET Input Operational Amplifiers 数据表 (Rev. D) | PDF | HTML | 2015-11-30 | ||
| 电子书 | The Signal e-book: 有关运算放大器设计主题的博客文章汇编 | PDF | HTML | 英语版 | PDF | HTML | 2018-1-31 | |
| 应用手册 | AN-272 Op Amp Booster Designs (Rev. B) | 2013-4-23 | ||||
| 应用手册 | Effect of Heavy Loads on Accuracy and Linearity of Op Amp Circuits (Rev. B) | 2013-4-22 | ||||
| 应用手册 | AN-263 Sine Wave Generation Techniques (Rev. C) | 2013-4-22 | ||||
| 应用手册 | Data Acq Using ADC0816 & ADC0817 8-Bit ADC w/On-Chip 16 Chan Multiplexr | 2004-5-10 | ||||
| 应用手册 | AN-293 Control Applications of CMOS DACs | 2004-5-10 | ||||
| 应用手册 | AN-447 Protection Schemes for BI-FET Amplifiers and Switches | 2004-5-2 | ||||
| 应用手册 | AN-253 LH0024 and LH0032 High Speed Op Amp Applications | 2004-5-2 | ||||
| 应用手册 | AN-275 CMOS D/A Converters Match Most Microprocessors | 2004-5-2 | ||||
| 应用手册 | Get Fast Stable Response From Improved Unity-Gain Followers | 2002-10-2 |
设计与开发
如需其他信息或资源，请点击以下任一标题进入详情页面查看（如有）。
AMP-PDK-EVM — 放大器高性能开发套件评估模块
放大器高性能开发套件 (PDK) 是一款用于测试常见运算放大器参数的评估模块 (EVM) 套件，与大多数运算放大器和比较器均兼容。该 EVM 套件提供了一个主板，主板上具有多个插槽式子卡选项以满足封装需求，使工程师能够快速评估和验证器件性能。
AMP-PDK-EVM 套件支持五种常用的业界通用封装，包括：
- D（SOIC-8 和 SOIC-14）
- PW (TSSOP-14)
- DGK (VSSOP-8)
- DBV（SOT23-5 和 SOT23-6）
- DCK（SC70-5 和 SC70-6）
DIP-ADAPTER-EVM — DIP 适配器评估模块
借助 DIP-Adapter-EVM 加快运算放大器的原型设计和测试，该 EVM 有助于快速轻松地连接小型表面贴装 IC 并且价格低廉。您可以使用随附的 Samtec 端子板连接任何受支持的运算放大器，或者将这些端子板直接连接至现有电路。
DIP-Adapter-EVM 套件支持六种常用的业界通用封装，包括：
- D 和 U (SOIC-8)
- PW (TSSOP-8)
- DGK（MSOP-8、VSSOP-8）
- DBV（SOT23-6、SOT23-5 和 SOT23-3）
- DCK（SC70-6 和 SC70-5）
- DRL (SOT563-6)
| 封装 | 引脚 | CAD 符号、封装和 3D 模型 |
|---|---|---|
| PDIP (P) | 8 | Ultra Librarian |
| SOIC (D) | 8 | Ultra Librarian |