ZHCSXX4D December   2004  – April 2025 CD74HC4067-Q1 , CD74HCT4067-Q1

PRODUCTION DATA  

  1.   1
  2. 1 特性
  3. 2 应用
  4. 3 说明
  5. 4 Pin Configuration and Functions
  6. 5 Absolute Maximum Ratings
  7. 6 ESD Ratings
  8. 7 Thermal Information
  9. 8 Recommended Operating Conditions
  10. 9 Electrical Characteristics: HC Devices
  11. 10Electrical Characteristics: HCT Devices
  12. 11Switching Characteristics HC
  13. 12Switching Characteristics HCT
  14. 13Analog Channel Specifications
  15. 14Parameter Measurement Information
  16. 15Detailed Description
    1. 15.1 Functional Block Diagram
    2. 15.2 Device Functional Modes
  17. 16Device and Documentation Support
    1. 16.1 接收文档更新通知
    2. 16.2 支持资源
    3. 16.3 Trademarks
    4. 16.4 静电放电警告
    5. 16.5 术语表
  18. 17Revision History
  19. 18Mechanical, Packaging, and Orderable Information

14 Parameter Measurement Information

CD74HCT4067-Q1 CD74HC4067-Q1 Frequency-Response Test CircuitFigure 14-1 Frequency-Response Test Circuit
CD74HCT4067-Q1 CD74HC4067-Q1 Control-to-Switch Feedthrough Noise Test CircuitFigure 14-3 Control-to-Switch Feedthrough Noise Test Circuit
CD74HCT4067-Q1 CD74HC4067-Q1 Load Circuit and Voltage WaveformsFigure 14-5 Load Circuit and Voltage Waveforms
CD74HCT4067-Q1 CD74HC4067-Q1 Sine-Wave Distortion Test CircuitFigure 14-2 Sine-Wave Distortion Test Circuit
CD74HCT4067-Q1 CD74HC4067-Q1 Switch OFF Signal Feedthrough Test CircuitFigure 14-4 Switch OFF Signal Feedthrough Test Circuit