TIDUEA0A March   2019  – September 2020

 

  1.   Description
  2.   Resources
  3.   Features
  4.   Applications
  5.   5
  6. 1System Description
    1. 1.1 Key System Specifications
  7. 2System Overview
    1. 2.1 Block Diagram
    2. 2.2 Design Considerations
    3. 2.3 Highlighted Products
      1. 2.3.1 Device Recommendation
      2. 2.3.2 Digital Temperature Sensor - TMP117
      3. 2.3.3 Digital Temperature Sensor - TMP116
      4. 2.3.4 ESD Protection Devices
    4. 2.4 System Design Theory
      1. 2.4.1 PT100, PT500, PT1000 based Measurement in Heat Meters
      2. 2.4.2 TMP117 Configuration as Temperature Sensor
      3. 2.4.3 Digital RTD Solution Using TMP117
      4. 2.4.4 Ambient Temperature Considerations
  8. 3Hardware, Software, Testing Requirements, and Test Results
    1. 3.1 Required Hardware and Software
      1. 3.1.1 Hardware
      2. 3.1.2 Interface Test Software for TMP116
    2. 3.2 Testing and Results
      1. 3.2.1 Test Setup for Performance Testing
      2. 3.2.2 EMI and EMC Test Requirements for DRTD
      3. 3.2.3 TMP117 EMI/EMC Test Results
      4. 3.2.4 TMP117 Based Temperature Probe Measurement Performance Test Results
      5. 3.2.5 TMP116 Based Temperature Probe Measurement Performance Test Results
      6. 3.2.6 I2C-bus Cable Length Considerations
      7. 3.2.7 Power Supply
      8. 3.2.8 ESD Test Results for TMP116
      9. 3.2.9 Summary
  9. 4Design Files
    1. 4.1 Schematics
    2. 4.2 Bill of Materials
    3. 4.3 Layout Prints
    4. 4.4 Altium Project
    5. 4.5 Gerber Files
    6. 4.6 Assembly Drawings
  10. 5Software Files
  11. 6Related Documentation
    1. 6.1 Trademarks
  12. 7About the Author
  13. 8Revision History

3.2.3 TMP117 EMI/EMC Test Results

The TMP117 has been tested using the requirements as per the standards summarized above. Table 3-2 below illustrates the results of the testing. As you can see, the TMP117 passes all of the listed standards. This design showcases the setup and subsequent results obtained when preforming the test as per IEC61000-4-3.

Table 3-2 TMP117 EMI/EMC Test Results

Test Number

Standard

Environment Class

Number of Samples

Result

1

 EN 61000 4-2 Electrostatic discharge, Contact

A,C

2

Pass
EN 61000 4-2 Electrostatic discharge, Air

A,C

2

Pass

2

 EN 61000-4-3 Electromagnetic field

A

2

Pass
EN 61000-4-3 Electromagnetic field

C

2

Pass
EN 61000-4-3 Electromagnetic field specifically caused by digital radio equipment

A

2

Pass
EN 61000-4-3 Electromagnetic field specifically caused by digital radio equipment

C

2

Pass

3

 EN 61000-4-4 Fast transients (bursts)

A,C

2

Pass

4

 EN 61000-4-5

A,C

1

Pass

5

 EN 61000-4-6

A

2

Pass
EN 61000-4-6

C

2

Pass

6

 EN 61000-4-8

A

2

Pass
EN 61000-4-8

C

2

Pass

7

 EN 55022 Conducted emission on signal and power DC lines

A,C

2

Pass

8

 EN 55022

A,C

2

Pass
The EN 61000-4-3 standard is used to determine a device's immunity to electromagnetic radiation. Four different tests were completed; two of them dealt with an electromagnetic field specifically caused by digital radio equipment. The testing requirement for this standard is shown below in Table 3-3 and Table 3-4.
Table 3-3 Test Requirements for Electromagnetic Field

Environment Class

A

B

C

Frequency Range

26 MHz–1000 MHz

Test Level

3 V / m

3 V / m

10 V / m

Modulation

AM (1KHz) 80%
Table 3-4 Test Requirements for Electromagnetic Field Caused by Digital RF

Environment Class

A

B

C

Frequency Range

800 MHz–960 MHz

1850 MHz–2700 MHz

Test Level

10 V / m

10 V / m

30 V / m

Modulation

AM (1 KHz) 80%

Figure 3-4 shows the physical test setup and Figure 3-3 shows the schematic. The TMP117 was tested for frequencies listed in EN-1434 with isolated I2C using digital isolators and shielded copper cables. Dwell time was 30 seconds with frequency steps of 1 MHz. No communication errors or abrupt change in temperature measurement was observed. No sudden change in temperature measurement was observed after removing the field.

GUID-20200806-CA0I-WCX1-MJHW-DTR7Z4PLDRZX-low.png Figure 3-3 EN 61000-4-3 Test Setup Diagram.
GUID-20200806-CA0I-KGNN-DK71-VB6FWKQ7PV1W-low.png Figure 3-4 EN 61000-4-3 Setup Inside the Chamber.