SNAA345 December   2020 LMK5C33216

 

  1.   Trademarks
  2. 1 Introduction
  3. 2 Wander Generation
    1. 2.1 Wander Generation MTIE Option 1, G.8262 EEC Option 1
    2. 2.2 Wander Generation TDEV G.8262 EEC Option 1
    3. 2.3 Wander Generation MTIE Stratum ITU-T G.8262 EEC Option 2
    4. 2.4 Wander Generation TDEV G.8262 EEC Option 2
  4. 3 Wander Transfer
    1. 3.1 Transfer Function of the PLL for Option 1 and Option 2
    2. 3.2 Wander Transfer TDEV G.8262 Option 2
  5. 4 Wander Tolerance
    1. 4.1 Wander Tolerance G.8262 Option 1
    2. 4.2 Wander Tolerance G.8262 Option 2
  6. 5 Jitter Tolerance
    1. 5.1 Jitter Tolerance G.8262 Option 1 and Option 2
  7. 6 Phase Transient Generation
    1. 6.1 Short-Term Phase Transient Response G.8262 Option 1
    2. 6.2 Short-Term Phase Transient Response G.8262 Option 2
    3. 6.3 Phase Transient Generation With Signal Interruptions G.8262 EEC Option 1
    4. 6.4 Phase Discontinuity G.8262 Option 1
    5. 6.5 Phase Discontinuity G.8262 Option 2
  8. 7 Holdover
    1. 7.1 Holdover G.8262 Option 1
    2. 7.2 Holdover G.8262 Option 2
  9. 8 Free-Run Accuracy
    1. 8.1 Free-Run Accuracy G.8262 Option 1 and Option 2
  10. 9 Pull-In and Hold-In
    1. 9.1 Pull-In Range G.8262 Option 1 and Option 2
  11. 10Conclusion
  12. 11References

3.2 Wander Transfer TDEV G.8262 Option 2

The process for this specification is to measure the output wander (TDEV) when the device is locked to a clock that has wander as defined by the TDEV mask shown in figure 8 in the G.8262 specification and Table 3-1 (Table 10 in the G.8262 specification) and to ensure that the TDEV output is below the mask shown in figure 11 in the G.8262 specification. Results from Section 3.1 offer sufficient information regarding the bandwidth of the DPLL to state that the LMK5C33216 meets the requirements for wander transfer TDEV G.8262 Option 2.

Table 3-1 Input Wander Tolerance (TDEV) for EEC-Option 2
TDEV LIMIT (ns) OBSERVATION INTERVAL τ (s)
17 0.1 < τ ≤ 3
5.77 × τ 3 < τ ≤ 30
31.6325 × τ0.5 30 < τ ≤ 1000