SLVK327A July   2026  – October 2026 TPS7H1301-SP , TPS7H1302-SP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 LETEFF and Range Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
  12. 9 Event Rate Calculations
  13. 10Summary
  14. 11Revision History
  15.   A References

1 Introduction

The TPS7H1301-SP and TPS7H1302-SP are radiation-hardened, charge pump positive-to-negative voltage inverter with an integrated negative low dropout. The devices features an input voltage range of 3V to 6.3V and are capable of providing an output current of 400mA.

The TPS7H1301-SP features a 500kHz (typical) charge pump switching frequency and provides an adjustable output voltage range of -0.6V to -6V. Its STAB pin enables direct access to the negative LDO error amplifier for external compensation.

The TPS7H1302-SP features a fixed -1.8V output voltage with a 1MHz (typical) charge pump switching frequency. By eliminating the need for external feedback resistors, the TPS7H1302-SP reduces both the external component count and overall design size.

The device is offered in a 14-pin CFP ceramic package. General device information and test conditions are listed in the overview information table. For more detailed technical specifications, user-guides, and application notes please go to TPS7H1301-SP product page or TPS7H1302-SP product page.

Table 1-1 Overview Information
DESCRIPTION(1)DEVICE INFORMATION
TI Part Number

TPS7H1301-SP

TPS7H1302-SP

Orderable Part Number

5962R2421501VXC

5962R2421502VXC

Device FunctionCharge Pump Voltage Inverter
TechnologyLBC7 (Linear BiCMOS 7)
Exposure FacilityFacility for Rare Istotope Beams, K500 Cyclotron (KSEE), Michigan State University (19.5MeV/nucleon) and Radiation Effects Facility, Cyclotron Institute, Texas A&M University (15MeV/nucleon)
Heavy Ion Fluence per Run1.00 × 107ions/cm2
Irradiation Temperature25°C (for SEB/SEGR testing), 25°C (for SET testing), and 125°C (for SEL testing)
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