SLVK327A July 2026 – October 2026 TPS7H1301-SP , TPS7H1302-SP
- 1
- 2
- Trademarks
- 1 Introduction
- 2 Single-Event Effects (SEE)
- 3 Device and Test Board Information
- 4 Irradiation Facility and Setup
- 5 LETEFF and Range Calculation
- 6 Test Setup and Procedures
- 7 Destructive Single-Event Effects (DSEE)
- 8 Single-Event Transients (SET)
- 9 Event Rate Calculations
- 10Summary
- 11Revision History
- A References
7.1 Single-Event Latch-up (SEL) Results
During the SEL testing the device was heated to 125°C by using PID controlled heat gun (MISTRAL 6 System (120V, 2400W)). The die temperature was verified using a standalone FLIR thermal camera prior to exposure to heavy ions at KSEE. The temperature of the die was constantly monitored during testing at TAMU through an IR camera integrated into the control loop to create closed-loop temperature control.
The species used for the SEL testing was 169Tm at 19.5MeV/nucleon (KSEE) and 165Ho at 15MeV/nucleon (TAMU). For both ions an angle of incidence of 0° was used to achieve a LETEFF of ≈75MeV·cm2/mg (for more details refer to Table 5-1). Flux of ≈105 ions/cm2/s and a fluence of ≈107 ions/cm2 per run was used. Run duration to achieve this fluence was ≈2 minutes. The 7 production devices were powered up and exposed to the heavy-ions using the maximum recommended input voltage of 6.3V and both min and max VOUT values of -0.6V and -6V, respectively for TPS7H1301-SP and VOUT value of -1.8V for TPS7H1302-SP. No SEL events were observed during all seven runs, indicating that the TPS7H130x-SP is SEL-free up to 75MeV×cm2/mg.Table 8-4 shows the SEL test conditions and results. Figure 7-1 and Figure 7-2 show a plot of the current versus time for runs 1 and 2, respectively.
| Run # | Unit # | Facility | Device | Production Type | Ion | LETEFF (MeV×cm2/mg) | Flux (ions/cm2/s) | Fluence (ions/cm2) | VIN (V) | VOUT (V) | IOUT (mA) | SEL (# Events) |
|---|---|---|---|---|---|---|---|---|---|---|---|---|
| 1 | 1 | KSEE | TPS7H1301-SP | Final | 169Tm | 75 | 1.17 x 105 | 1 x 107 | 6.3 | -6 | 75 | 0 |
| 2 | 2 | KSEE | TPS7H1301-SP | Final | 169Tm | 75 | 1.07 x 105 | 1 x 107 | 6.3 | -0.6 | 400 | 0 |
| 3 | 3 | KSEE | TPS7H1301-SP | Final | 169Tm | 75 | 1.11 x 105 | 1 x 107 | 6.3 | -0.6 | 400 | 0 |
4 | 4 | KSEE | TPS7H1301-SP | Final | 169Tm | 75 | 1.15 x 105 | 1 x 107 | 6.3 | -6 | 75 | 0 |
| 19 | 11 | KSEE | TPS7H1302-SP | Final | 169Tm | 75 | 1.06 x 105 | 1 x 107 | 6.3 | -1.8 | 400 | 0 |
| 20 | 12 | KSEE | TPS7H1302-SP | Final | 169Tm | 75 | 1.09 x 105 | 1 x 107 | 6.3 | -1.8 | 400 | 0 |
| 21 | 13 | KSEE | TPS7H1302-SP | Final | 169Tm | 75 | 1.05 x 105 | 1 x 107 | 6.3 | -1.8 | 400 | 0 |
Using the MFTF method described in Single-Event Effects (SEE) Confidence Interval Calculations application report and combining (or summing) the fluences of the seven runs at 125°C (7 × 107), the upper-bound cross-section (using a 95% confidence level) is calculated as:
σSEL ≤ 5.27 × 10-8 cm2/device for LETEFF = 75MeV×cm2/mg and T = 125°C.
Figure 7-1 SEL Current versus Time for Run #1 at T = 125°C, VOUT=-6V, and IOUT=75mA
Figure 7-2 SEL Current versus Time for Run #2 at T = 125°C, VOUT=-0.6V, and IOUT=400mA