SLVK327A July   2026  – October 2026 TPS7H1301-SP , TPS7H1302-SP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 LETEFF and Range Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
  12. 9 Event Rate Calculations
  13. 10Summary
  14. 11Revision History
  15.   A References

7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results

During the SEB/SEGR characterization, the device was tested at room temperature of approximately 25°C. The device was tested under both the enabled and disabled mode. For the SEB-Off mode the device was disabled using the EN-pin by forcing 0V (using Ch #1 of a Keysight E36311A). During the SEB/SEGR testing with the device enabled/disabled, not a single input current event was observed.

The species used for the SEB testing was 169Tm at 19.5 MeV/nucleon (KSEE) and 165Ho at 15MeV/nucleon (TAMU). For both ions an angle of 0° was used to achieve a LETEFF of ≈75MeV·cm2/mg (for more details refer to Table 5-1). Flux of ≈105 ions/cm2/s and a fluence of ≈107 ions/cm2 per run was used. Run duration to achieve this fluence was ≈2 minutes. The 7 production devices (same as used in SEL testing) were powered up and exposed to the heavy-ions using the maximum recommended input voltage of 6.3V and both min and max VOUT values of -0.6V and -6V, respectively for TPS7H1301-SP and VOUT value of -1.8V for TPS7H1302-SP. No SEB/SEGR current events were observed during the 14 runs, indicating that the TPS7H130x-SP is SEB/SEGR-free up to LETEFF = 75MeV·cm2/mg. Table 8-4 shows the SEB/SEGR test conditions and results.

Table 7-2 Summary of TPS7H130x-SP SEB/SEGR Test Conditions and Results
Run #Unit #

Facility

Device

Production Type

IonLETEFF (MeV·cm2/mg)Flux (ions/cm2/s)Fluence (ions/cm2)Enabled Status

VIN (V)

VOUT (V)

IOUT (mA)

SEB (# Events)

5

1

KSEE

TPS7H1301-SP

Final

169Tm

75

1.35 x 105

9.99 x 106

EN

6.3

-6

75

0

6

1

KSEETPS7H1301-SPFinal169Tm

75

1.07 x 105

9.99 x 106DIS

6.3

-

-

0

7

2

KSEETPS7H1301-SPFinal169Tm

75

1.05 x 105

1.00 x 107

EN

6.3

-0.6

400

0

8

2

KSEETPS7H1301-SPFinal169Tm

75

1.16 x 105

1.00 x 107

DIS

6.3

-

-

0

9

3

KSEETPS7H1301-SPFinal169Tm

75

1.14 x 105

1.00 x 107

EN

6.3

-0.6

400

0

10

3

KSEETPS7H1301-SPFinal169Tm

75

1.16 x 105

1.00 x 107

DIS

6.3

-

-

0

11

4

KSEETPS7H1301-SPFinal169Tm

75

1.16 x 105

1.00 x 107

EN

6.3

-6

75

0

12

4

KSEETPS7H1301-SPFinal169Tm

75

1.15 x 105

1.00 x 107

DIS

6.3

-

-

0

2211KSEETPS7H1302-SPFinal169Tm759.86 x 1041.00 x 107EN6.3-1.84000
2311KSEETPS7H1302-SPFinal169Tm751.05 x 1051.00 x 107DIS6.3--0
2412KSEETPS7H1302-SPFinal169Tm751.06 x 1051.00 x 107EN6.3-1.84000
2512KSEETPS7H1302-SPFinal169Tm751.11 x 1051.00 x 107DIS6.3--0
2613KSEETPS7H1302-SPFinal169Tm751.06 x 1051.00 x 107EN6.3-1.84000
2713KSEETPS7H1302-SPFinal169Tm751.05 x 1051.00 x 107DIS6.3--0

Using the MFTF method described in Single-Event Effects (SEE) Confidence Interval Calculations application report, the upper-bound cross-section (using a 95% confidence level) is calculated as:

σSEB ≤ 2.63 x 10-8 cm2/device for LETEFF = 75MeV·cm2/mg and T = 25°C.

SEB On Current v. Time for Run #5 at T = 25°C, VOUT=-6V, and IOUT=75mAFigure 7-3 SEB On Current v. Time for Run #5 at T = 25°C, VOUT=-6V, and IOUT=75mA
SEB On Current v. Time for Run #7 at T = 25°C, VOUT=-0.6V, and IOUT=400mAFigure 7-4 SEB On Current v. Time for Run #7 at T = 25°C, VOUT=-0.6V, and IOUT=400mA
SEB Off Current v. Time for Run #6 at T = 25°C and VIN=6.3VFigure 7-5 SEB Off Current v. Time for Run #6 at T = 25°C and VIN=6.3V