SLVK282 April   2026 ISOS510-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Test Setup and Procedures
  9. 6 Single-Event Latch-up (SEL) Results
  10. 7 Single-Event Transients (SET) Results
  11. 8 Event Rate Calculations
  12. 9 Summary
  13. 10References

7 Single-Event Transients (SET) Results

SET are defined as heavy-ion-induced transients upsets on the VOUT of the ISOS510-SEP.

Testing was performed at room temperature (no external temperature control applied). The heavy-ions species used for SET testing was 109Ag, 84Kr, 40Ar and 14N at 15MeV/nucleon. 109Ag, 84Kr, 40Ar, and 14N for LETEFF from 1.34 to 47MeV×cm2/mg, for more details refer to Table 4-1. Flux of 105 ions×cm2/s and a fluence of 1 × 107 ions/cm2, per run were used for the characterization of the SET.

Table 7-1 shows the signal size, sample rate, trigger type, value, and signal for all scopes.

Table 7-1 Scope Settings Only one Signal was used as a trigger source at a time, this table presents all possible sources for a given scope, the same is valid for the trigger type. All percentage specified on the trigger value are deviation from the nominal value.
Scope ModelTrigger SignalTrigger TypeTrigger ValueRecord LengthSample Rate
PXIe-5172VOUTWindow±3%10k100MS/s
±5%

For the VIN of approximately 4.3V and VCE of 3.3V with a VOUT of approximately 1V, four units were characterized from 47MeV down to 1.34MeV. 109Ag was used to achieve LETEFF = 47MeV and 14N was used to achieve LETEFF = 1.34MeV. A PXIe-5172 scope was used to monitor the VOUT signals of the ISOS510-SEP with VOUT triggering off a 3% and 5% window. Table 7-2 summarizes the results for the four units tested.

Typical Low and High observed VOUT transients are shown in Figure 7-1 and Figure 7-2 respectively. Figure 7-3 show that although the signal goes beyond the 3% window, the signal recovers back to nominal and the device continues to operate properly.

Table 7-4 shows the Weibull fit parameters and the Weibull fit plot. Figure 7-4 and Figure 7-5 shows the Weibull fit plots for the VOUT 3% and 5% triggers.

Table 7-2 Summary of ISOS510-SEP SET Test Condition and Results
RUN # UNIT # Facility Ion LETEFF (MeV×cm2/mg) FLUX (ions×cm2/mg) FLUENCE (number of ions) Window Trigger PXIe-5172 VOUT SET Upsets
13 4 TAMU 109Ag 47 1.00 × 105 1.00 × 107 5% 2655
14 4 TAMU 109Ag 47 1.00 × 105 1.00 × 107 3% 2890
15 5 TAMU 84Kr 30.1 1.00 × 105 1.00 × 107 5% 2386
16 5 TAMU 84Kr 30.1 1.00 × 105 1.00 × 107 3% 2796
17 6 TAMU 40Ar 8.54 1.00 × 105 1.00 × 107 5% 1885
18 6 TAMU 40Ar 8.54 1.00 × 105 1.00 × 107 3% 2279
19 7 TAMU 14N 1.34 1.00 × 105 1.00 × 107 5% 690
20 7 TAMU 14N 1.34 1.00 × 105 1.00 × 107 3% 2021

Figure 7-1 shows the typical low observed VOUT for Run #14. Transient reached a peak of approximately 0.14V and recovered within approximately 18.8μs

Typical Low Observed VOUT Transient on Run #14 Figure 7-1 Typical Low Observed VOUT Transient on Run #14

Figure 7-2 shows the typical high observed VOUT for Run #14. Transient reached a peak of approximately 2.51V and recovered within approximately 17.3μs

Typical High Observed VOUT Transient on Run #14 Figure 7-2 Typical High Observed VOUT Transient on Run #14
Overlay of all VOUT Transients on Run # 14 Figure 7-3 Overlay of all VOUT Transients on Run # 14

Using the MFTF method, the upper-bound cross section (using a 95% confidence level) is calculated for the different SETs as shown below.

Table 7-3 Upper Bound Cross Section at 95% Confidence Interval
Ion LETEFF (MeV×cm2/mg) FLUENCE (# ions) Window Trigger PXIe-5172 VOUT SET Upsets Upper Bound Cross Section (cm2 /device)
109Ag 47 1.00 × 107 5% 2655 2.76 × 10–4
109Ag 47 1.00 × 107 3% 2890 3.00 × 10–4
84Kr 30.1 1.00 × 107 5% 2386 2.48 × 10–4
84Kr 30.1 1.00 × 107 3% 2796 2.90 × 10–4
40Ar 8.54 1.00 × 107 5% 1885 1.97 × 10–4
40Ar 8.54 1.00 × 107 3% 2279 2.37 × 10–4
14N 1.34 1.00 × 107 5% 690 7.43 × 10–5
14N 1.34 1.00 × 107 3% 2021 2.11 × 10–4
Table 7-4 Weibull Parameters for VOUT Signal
Parameters 3% 5%
Cross-saturation (cm2) 4.18 × 10–4 3.43 × 10–4
w 14.99 14.98
s 0.15 0.32
Weibull Fit for VOUT 3% Trigger Figure 7-4 Weibull Fit for VOUT 3% Trigger
Weibull Fit for VOUT 5% Trigger Figure 7-5 Weibull Fit for VOUT 5% Trigger