SLVK282 April   2026 ISOS510-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. Introduction
  5. Single-Event Effects (SEE)
  6. Device and Test Board Information
  7. Irradiation Facility and Setup
  8. Test Setup and Procedures
  9. Single-Event Latch-up (SEL) Results
  10. Single-Event Transients (SET) Results
  11. Event Rate Calculations
  12. Summary
  13. 10References

Irradiation Facility and Setup

The heavy-ion species used for the SEE studies on this product were provided and delivered by the Texas A&M University (TAMU) Cyclotron Radiation Effects Facility using a K500 superconducting cyclotron and an advanced electron cyclotron resonance (ECR) ion source. At the fluxes used, ion beams had good flux stability and high irradiation uniformity over a 1in diameter circular cross-sectional area for the in-air station. Uniformity is achieved by magnetic defocusing. The flux of the beam is regulated over a broad range spanning several orders of magnitude. For these studies, ion flux of 105ions/cm2×s was used to provide heavy-ion fluences of 1 × 107 – 1.5 × 107ions/cm2. The TAMU facility uses a beam port that has a 1-mil Aramica window to allow in-air testing while maintaining the vacuum within the particle accelerator. The in-air gap between the device and the ion beam port window was maintained at 40mm for all runs.

For the experiments conducted on this report, there were four ions used, 109Ag, 84Kr, 40Ar, and 14N. The list of ions and the respective LET are:

Table 4-1 Ion LETEFF and Range in Silicon
FacilityBeam Energy (MeV/nucleon)Ion TypeNumber of Degrader StepsDegrader Angle (°)Beam Port WindowAir Gap (mm)Angle of IncidenceLETEFF (MeV×cm2/mg)Beam Uniformity across Runs (%)Range in Silicon (μm)
TAMU15109Ag001-mil Aramica4004794% – 96%95.1
TAMU1584Kr001-mil Aramica40030.195%114.3
TAMU1540Ar001-mil Aramica4008.5496%177
TAMU1514N001-mil Aramica4001.3490% – 91%367.8

Figure 4-2 shows EVM#1 in front of the beam line at the TAMU Cyclotron facility. The in-air gap between the device and the ion beam port window was maintained at 40mm for all runs.Figure 4-1 shows EVM#1 through the beam line camera at TAMU Cyclotron facility. A FLIR (FLIR ONE Pro LT) thermal camera was used to validate die temperature to make sure the device was accurately heated, (see Figure 4-3).

 ISOS510-SEP EVM through Beam Line Camera at the Texas A&M CyclotronFigure 4-1 ISOS510-SEP EVM through Beam Line Camera at the Texas A&M Cyclotron
 ISOS510-SEP EVM in Front of Heavy-Ion Beam Exit Port at the Texas A&M CyclotronFigure 4-2 ISOS510-SEP EVM in Front of Heavy-Ion Beam Exit Port at the Texas A&M Cyclotron
 ISOS510-SEP EVM FLIR Thermal Image for SELFigure 4-3 ISOS510-SEP EVM FLIR Thermal Image for SEL