SLVK282 April 2026 ISOS510-SEP
The heavy-ion species used for the SEE studies on this product were provided and delivered by the Texas A&M University (TAMU) Cyclotron Radiation Effects Facility using a K500 superconducting cyclotron and an advanced electron cyclotron resonance (ECR) ion source. At the fluxes used, ion beams had good flux stability and high irradiation uniformity over a 1in diameter circular cross-sectional area for the in-air station. Uniformity is achieved by magnetic defocusing. The flux of the beam is regulated over a broad range spanning several orders of magnitude. For these studies, ion flux of 105ions/cm2×s was used to provide heavy-ion fluences of 1 × 107 – 1.5 × 107ions/cm2. The TAMU facility uses a beam port that has a 1-mil Aramica window to allow in-air testing while maintaining the vacuum within the particle accelerator. The in-air gap between the device and the ion beam port window was maintained at 40mm for all runs.
For the experiments conducted on this report, there were four ions used, 109Ag, 84Kr, 40Ar, and 14N. The list of ions and the respective LET are:
| Facility | Beam Energy (MeV/nucleon) | Ion Type | Number of Degrader Steps | Degrader Angle (°) | Beam Port Window | Air Gap (mm) | Angle of Incidence | LETEFF (MeV×cm2/mg) | Beam Uniformity across Runs (%) | Range in Silicon (μm) |
|---|---|---|---|---|---|---|---|---|---|---|
| TAMU | 15 | 109Ag | 0 | 0 | 1-mil Aramica | 40 | 0 | 47 | 94% – 96% | 95.1 |
| TAMU | 15 | 84Kr | 0 | 0 | 1-mil Aramica | 40 | 0 | 30.1 | 95% | 114.3 |
| TAMU | 15 | 40Ar | 0 | 0 | 1-mil Aramica | 40 | 0 | 8.54 | 96% | 177 |
| TAMU | 15 | 14N | 0 | 0 | 1-mil Aramica | 40 | 0 | 1.34 | 90% – 91% | 367.8 |
Figure 4-2 shows EVM#1 in front of the beam line at the TAMU Cyclotron facility. The in-air gap between the device and the ion beam port window was maintained at 40mm for all runs.Figure 4-1 shows EVM#1 through the beam line camera at TAMU Cyclotron facility. A FLIR (FLIR ONE Pro LT) thermal camera was used to validate die temperature to make sure the device was accurately heated, (see Figure 4-3).
Figure 4-1 ISOS510-SEP EVM through Beam Line Camera at the Texas A&M Cyclotron
Figure 4-2 ISOS510-SEP EVM in Front of Heavy-Ion Beam Exit Port at the Texas A&M Cyclotron
Figure 4-3 ISOS510-SEP EVM FLIR Thermal Image for SEL