SLVK244 January   2026 TRF0213-SEP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1Overview
  5. 2Single-Event Effects
  6. 3Test Device and Evaluation Board Information
  7. 4Irradiation Facility and Setup
  8. 5Depth, Range, and LETEFF Calculation
  9. 6Test Set-Up and Procedures
  10. 7Single-Event Latch-up (SEL) Results
  11. 8Single-Event Transients (SET) Results
  12. 9Summary
  13.   A Total Ionizing Dose from SEE Experiments
  14.   B References

B References

  1. M. Shoga and D. Binder, “Theory of Single Event Latchup in Complementary Metal-Oxide Semiconductor ICs”, IEEE Trans. Nucl. Sci,, 33(6), Dec. 1986, pp. 1714-1717.
  2. G. Bruguier and J.M. Palau, “Single particle-induced latchup”, IEEE Trans. Nucl. Sci, Vol. 43(2), Mar. 1996, pp. 522-532.
  3. Texas Instruments, Radiation Handbook for Electronics, e-book.
  4. Cyclotron Institute, Texas A&M University, Texas A&M University Cyclotron Institute Radiation Effects Facility, webpage.
  5. Ziegler, James F. SRIM- The Stopping and Range of Ions in Matter, webpage.
  6. D. Kececioglu, “Reliability and Life Testing Handbook”, Vol. 1, PTR Prentice Hall, New Jersey,1993, pp. 186-193.
  7. Vanderbilt University, ISDE CRÈME-MC, webpage.
  8. A. J. Tylka, et al., "CREME96: A Revision of the Cosmic Ray Effects on Micro-Electronics Code", IEEE Trans. Nucl. Sci., 44(6), 1997, pp. 2150-2160.
  9. A. J. Tylka, W. F. Dietrich, and P. R. Bobery, “Probability distributions of high-energy solar-heavy-ion fluxes from IMP-8: 1973-1996”, IEEE Trans. on Nucl. Sci., 44(6), Dec. 1997, pp. 2140 – 2149.
  10. A. J. Tylka, J. H. Adams, P. R. Boberg, et al.,“CREME96: A Revision of the Cosmic Ray Effects on Micro-Electronics Code”, Trans. on Nucl. Sci, 44(6), Dec. 1997, pp. 2150 – 2160.