SLVAFF0 September   2022 TPS25947 , TPS2597 , TPS25981 , TPS25982 , TPS25985

 

  1.   Abstract
  2.   Trademarks
  3. 1Understanding the FET SOA
  4. 2Ensuring FET SOA in Hot-Swap Design
  5. 3eFuse Ensuring Integrated FET SOA Operation
    1. 3.1 Thermal Shutdown
    2. 3.2 eFuse Response to Events Stressing Integrated FET
  6. 4Plotting eFuse AOA
  7. 5eFuse Application Design Recommendations to Ensure Integrated FET Reliability
  8. 6Summary
  9. 7References

7 References

  1. Texas Instruments, Understanding MOSFET data sheets, Part 2 - Safe operating area (SOA) graph, E2ETM Forum
  2. Texas Instruments, Robust Hot Swap Design, application note
  3. G. Breglio, F. Frisina, A. Magri, and P. Spirito, Electro-Thermal Instability in Low Voltage Power MOS: Experimental Characterization, IEEE Proceedings ISPSD 1999, Toronto, p233
  4. Texas Instruments, 11 Ways to Protect Your Power Path
  5. Texas Instruments, TPS2597xx 2.7 V–23 V, 7-A, 9.8-mΩ eFuse With Accurate Current Monitor and Transient Overcurrent Blanking data sheet
  6. Texas Instruments, Selecting TVS diodes in hot-swap and ORing applications, E2ETM Forum
  7. Texas Instruments, Reducing Power Loss and Overheating During Faults with eFuses, application note
  8. Texas Instruments, Calculating FIT for a Mission Profile, application note