SFFSB97 April   2026 CD74HC4067-Q1

 

  1.   1
  2.   Trademarks
  3. 1Overview
  4. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 DW (SOIC, 24) Package
    2. 2.2 RGY (QFN, 24) Package
    3. 2.3 DGS (VSSOP, 24) Package
    4. 2.4 PW (TSSOP, 24) Package
  5. 3Failure Mode Distribution (FMD)
  6. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 DW (SOIC, 24) Package
    2. 4.2 RGY (QFN, 24) Package
    3. 4.3 DGS (VSSOP, 24) Package
    4. 4.4 PW (TSSOP, 24) Package
  7. 5Revision History

4.1 DW (SOIC, 24) Package

Figure 4-1 shows the CD74HC4067-Q1 pin diagram for the DW (SOIC, 24) package. For a detailed description of the device pins, see the Pin Configuration and Functions section in the CD74HC4067-Q1 datasheet.

CD74HC4067-Q1 Pin Diagram (DW (SOIC, 24)) PackageFigure 4-1 Pin Diagram (DW (SOIC, 24)) Package
Table 4-2 Pin FMA for Device Pins Short-Circuited to Ground
Pin Name Pin No. Description of Potential Failure Effects Failure Effect Class
COMMON I/O 1 There is corruption of the signal passed onto the IX pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I7 2 There is corruption of the signal passed onto the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I6 3 There is corruption of the signal passed onto the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I5 4 There is corruption of the signal passed onto the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I4 5 There is corruption of the signal passed onto the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I3 6 There is corruption of the signal passed onto the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I2 7 There is corruption of the signal passed onto the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I1 8 There is corruption of the signal passed onto the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I0 9 There is corruption of the signal passed onto the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
S0 10 The address is stuck low. The pin cannot control switch states. B
S1 11 The address is stuck low. The pin cannot control switch states. B
GND 12 There is no effect on the device. The device operates as normal. D
S3 13 The address is stuck low. The pin cannot control switch states. B
S2 14 The address is stuck low. The pin cannot control switch states. B
E 15 EN is stuck low. The pin can no longer disables the device without a power down. B
I15 16 There is corruption of the signal passed onto the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I14 17 There is corruption of the signal passed onto the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I13 18 There is corruption of the signal passed onto the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I12 19 There is corruption of the signal passed onto the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I11 20 There is corruption of the signal passed onto the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I10 21 There is corruption of the signal passed onto the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I19 22 There is corruption of the signal passed onto the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I18 23 There is corruption of the signal passed onto the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
VCC 24 The device is not powered. The device is not functional. Observe that the absolute maximum ratings for all pins of the device are met; otherwise, damage to the device is plausible. A
Table 4-3 Pin FMA for Device Pins Open-Circuited
Pin Name Pin No. Description of Potential Failure Effects Failure Effect Class
COMMON I/O 1 There is corruption of the signal passed onto the IX pin. B
I7 2 There is corruption of the signal passed onto the COMMON pin. B
I6 3 There is corruption of the signal passed onto the COMMON pin. B
I5 4 There is corruption of the signal passed onto the COMMON pin. B
I4 5 There is corruption of the signal passed onto the COMMON pin. B
I3 6 There is corruption of the signal passed onto the COMMON pin. B
I2 7 There is corruption of the signal passed onto the COMMON pin. B
I1 8 There is corruption of the signal passed onto the COMMON pin. B
I0 9 There is corruption of the signal passed onto the COMMON pin. B
S0 10 The address is stuck low. The pin cannot control switch states. B
S1 11 The address is stuck low. The pin cannot control switch states. B
GND 12 There is no effect on the device. The device operates as normal. A
S3 13 The address is stuck low. The pin cannot control switch states. B
S2 14 The address is stuck low. The pin cannot control switch states. B
E 15 EN is stuck low. The pin no longer disables the device without a power down. B
I15 16 There is corruption of the signal passed onto the COMMON pin. B
I14 17 There is corruption of the signal passed onto the COMMON pin. B
I13 18 There is corruption of the signal passed onto the COMMON pin. B
I12 19 There is corruption of the signal passed onto the COMMON pin. B
I11 20 There is corruption of the signal passed onto the COMMON pin. B
I10 21 There is corruption of the signal passed onto the COMMON pin. B
I9 22 There is corruption of the signal passed onto the COMMON pin. B
I8 23 There is corruption of the signal passed onto the COMMON pin. B
VCC 24 The device is not powered. The device is not functional. B
Table 4-4 Pin FMA for Device Pins Short-Circuited to Adjacent Pin
Pin Name Pin No. Shorted to Description of Potential Failure Effects Failure Effect Class
COMMON I/O 1 I7 There is possible corruption of the signal passed on to the IX pin. B
I7 2 I6 There is possible corruption of the signal passed on to the IX and COMMON pin. B
I6 3 I5 There is possible corruption of the signal passed on to the IX and COMMON pin. B
I5 4 I4 There is possible corruption of the signal passed on to the IX and COMMON pin. B
I4 5 I3 There is possible corruption of the signal passed on to the IX and COMMON pin. B
I3 6 I2 There is possible corruption of the signal passed on to the IX and COMMON pin. B
I2 7 I1 There is possible corruption of the signal passed on to the IX and COMMON pin. B
I1 8 I0 Possible corruption of the signal passed on to the IX and COMMON pin. B
I0 9 S0 There is possible corruption of the signal passed on to the IX and COMMON pin. B
S0 10 S1 There is possible corruption of the signal passed on to the IX and COMMON pin. B
S1 11 GND There is possible damage to device if the signal voltage is negative. Observe that the absolute maximum ratings for all pins of the device are met; otherwise, damage to the device is possible. A
GND 12 S3 There is possible damage to device if the signal voltage is negative. Observe that the absolute maximum ratings for all pins of the device are met; otherwise, damage to the device is possible. A
S3 13 S2 Control of the address pin is lost. The pin cannot control switch states. B
S2 14 E There is possible corruption of the signal passed onto the COMMON pin. The switch state is undefined. B
E 15 I15 There is possible corruption of the signal passed onto the COMMON pin. The switch state is undefined. B
I15 16 I14 There is possible corruption of the signal passed on to the IX and COMMON pin. B
I14 17 I13 There is possible corruption of the signal passed on to the IX and COMMON pin. B
I13 18 I12 There is possible corruption of the signal passed on to the IX and COMMON pin. B
I12 19 I11 There is possible corruption of the signal passed on to the IX and COMMON pin. B
I11 20 I10 There is possible corruption of the signal passed on to the IX and COMMON pin. B
I10 21 I9 There is possible corruption of the signal passed on to the IX and COMMON pin. B
I9 22 I8 There is possible corruption of the signal passed on to the IX and COMMON pin. B
I8 23 VCC There is corruption of the signal passed on to the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
VCC 24 COMMON I/O This pin is not considered. This pin is a corner pin. D
Table 4-5 Pin FMA for Device Pins Short-Circuited to Supply
Pin Name Pin No. Description of Potential Failure Effects Failure Effect Class
COMMON I/O 1 There is corruption of the signal passed on to the IX pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I7 2 There is corruption of the signal passed on to the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I6 3 There is corruption of the signal passed on to the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I5 4 There is corruption of the signal passed on to the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I4 5 There is corruption of the signal passed on to the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I3 6 There is corruption of the signal passed on to the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I2 7 There is corruption of the signal passed on to the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I1 8 There is corruption of the signal passed on to the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I0 9 There is corruption of the signal passed on to the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
S0 10 The address is stuck high. The pin cannot control switch states. B
S1 11 The address is stuck high. The pin cannot control switch states. B
GND 12 The device is not powered and not functional. Observe that the absolute maximum ratings for all pins of the device are met; otherwise, damage to the device is possible. A
S3 13 The address is stuck high. The pin cannot control switch states. B
S2 14 The address is stuck high. The pin cannot control switch states. B
E 15 EN is stuck high. The pin can no longer enable the device. B
I15 16 There is corruption of the signal passed on to the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I14 17 There is corruption of the signal passed on to the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I13 18 There is corruption of the signal passed on to the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I12 19 There is corruption of the signal passed on to the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I11 20 There is corruption of the signal passed on to the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I10 21 There is corruption of the signal passed on to the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I9 22 There is corruption of the signal passed on to the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I8 23 There is corruption of the signal passed on to the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
VCC 24 There is no effect on the device. The device operates as normal. D