SFFSB97 April   2026 CD74HC4067-Q1

 

  1.   1
  2.   Trademarks
  3. 1Overview
  4. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 DW (SOIC, 24) Package
    2. 2.2 RGY (QFN, 24) Package
    3. 2.3 DGS (VSSOP, 24) Package
    4. 2.4 PW (TSSOP, 24) Package
  5. 3Failure Mode Distribution (FMD)
  6. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 DW (SOIC, 24) Package
    2. 4.2 RGY (QFN, 24) Package
    3. 4.3 DGS (VSSOP, 24) Package
    4. 4.4 PW (TSSOP, 24) Package
  7. 5Revision History

4.2 RGY (QFN, 24) Package

Figure 4-2 shows the CD74HC4067-Q1 pin diagram for the RGY (QFN, 24) package. For a detailed description of the device pins, see the Pin Configuration and Functions section in the CD74HC4067-Q1 datasheet.

Figure 4-2 Pin Diagram (RGY (QFN, 24) Package)
Table 4-6 Pin FMA for Device Pins Short-Circuited to Ground
Pin Name Pin No. Description of Potential Failure Effects Failure Effect Class
COMMON I/O 1 There is corruption of the signal passed onto the IX pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I7 2 There is corruption of the signal passed onto the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I6 3 There is corruption of the signal passed onto the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I5 4 There is corruption of the signal passed onto the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I4 5 There is corruption of the signal passed onto the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I3 6 There is corruption of the signal passed onto the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I2 7 There is corruption of the signal passed onto the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I1 8 There is corruption of the signal passed onto the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I0 9 There is corruption of the signal passed onto the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
S0 10 The address is stuck low. The pin cannot control switch states. B
S1 11 The address is stuck low. The pin cannot control switch states. B
GND 12 There is no effect on the device. The device operates as normal. D
S3 13 The address is stuck low. The pin cannot control switch states. B
S2 14 The address is stuck low. The pin cannot control switch states. B
E 15 EN is stuck low. The pin can no longer disable the device without a power down. B
I15 16 There is corruption of the signal passed onto the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I14 17 There is corruption of the signal passed onto the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I13 18 There is corruption of the signal passed onto the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I12 19 There is corruption of the signal passed onto the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I11 20 There is corruption of the signal passed onto the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I10 21 There is corruption of the signal passed onto the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I9 22 There is corruption of the signal passed onto the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I8 23 There is corruption of the signal passed onto the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
VCC 24 The device is not powered. The device is not functional. Observe that the absolute maximum ratings for all pins of the device are met; otherwise, damage to the device is possible. A
Thermal Pad – There is no effect on the device. The device operates as normal. D
Table 4-7 Pin FMA for Device Pins Open-Circuited
Pin Name Pin No. Description of Potential Failure Effects Failure Effect Class
COMMON I/O 1 There is corruption of the signal passed onto the IX pin. B
I7 2 There is corruption of the signal passed onto the COMMON pin. B
I6 3 There is corruption of the signal passed onto the COMMON pin. B
I5 4 There is corruption of the signal passed onto the COMMON pin. B
I4 5 There is corruption of the signal passed onto the COMMON pin. B
I3 6 There is corruption of the signal passed onto the COMMON pin. B
I2 7 There is corruption of the signal passed onto the COMMON pin. B
I1 8 There is corruption of the signal passed onto the COMMON pin. B
I0 9 There is corruption of the signal passed onto the COMMON pin. B
S0 10 The address is stuck low. The pin cannot control switch states. B
S1 11 The address is stuck low. The pin cannot control switch states. B
GND 12 There is no effect on the device. The device operates as normal. A
S3 13 The address is stuck low. The pin cannot control switch states. B
S2 14 The address is stuck low. The pin cannot control switch states. B
E 15 EN is stuck low. The pin can no longer disable the device without a power down. B
I15 16 There is corruption of the signal passed onto the COMMON pin. B
I14 17 There is corruption of the signal passed onto the COMMON pin. B
I13 18 There is corruption of the signal passed onto the COMMON pin. B
I12 19 There is corruption of the signal passed onto the COMMON pin. B
I11 20 There is corruption of the signal passed onto the COMMON pin. B
I10 21 There is corruption of the signal passed onto the COMMON pin. B
I9 22 There is corruption of the signal passed onto the COMMON pin. B
I8 23 There is corruption of the signal passed onto the COMMON pin. B
VCC 24 The device is not powered. The device is not functional. B
Thermal Pad – There is no effect on the device. The device operates as normal.
Table 4-8 Pin FMA for Device Pins Short-Circuited to Adjacent Pin
Pin NamePin No.Shorted toDescription of Potential Failure EffectsFailure Effect Class
COMMON I/O1I7There is possible corruption of the signal passed on to the IX pin.B
I72I6There is possible corruption of the signal passed on to the IX and COMMON pin.B
I63I5There is possible corruption of the signal passed on to the IX and COMMON pin.B
I54I4There is possible corruption of the signal passed on to the IX and COMMON pin.B
I45I3There is possible corruption of the signal passed on to the IX and COMMON pin.B
I36I2There is possible corruption of the signal passed on to the IX and COMMON pin.B
I27I1There is possible corruption of the signal passed on to the IX and COMMON pin.B
I18I0There is possible corruption of the signal passed on to the IX and COMMON pin.B
I09S0There is possible corruption of the signal passed on to the IX and COMMON pin.B
S010S1There is possible corruption of the signal passed on to the IX and COMMON pin.B
S111GNDThere is possible damage to the device if the signal voltage is negative. Observe that the absolute maximum ratings for all pins of the device are met; otherwise, damage to the device is possible.A
GND12S3There is possible damage to the device if the signal voltage is negative. Observe that the absolute maximum ratings for all pins of the device are met; otherwise, damage to the device is possible.A
S313S2Control of the address pin is lost. The pin cannot control switch states.B
S214EThere is possible corruption of the signal passed onto the COMMON pin. The switch state is undefined.B
E15I15There is possible corruption of the signal passed onto the COMMON pin. The switch state is undefined.B
I1516I14There is possible corruption of the signal passed on to the IX and COMMON pin.B
I1417I13There is possible corruption of the signal passed on to the IX and COMMON pin.B
I1318I12There is possible corruption of the signal passed on to the IX and COMMON pin.B
I1219I11There is possible corruption of the signal passed on to the IX and COMMON pin.B
I1120I10There is possible corruption of the signal passed on to the IX and COMMON pin.B
I1021I9There is possible corruption of the signal passed on to the IX and COMMON pin.B
I922I8There is possible corruption of the signal passed on to the IX and COMMON pin.B
I823VCCThere is corruption of the signal passed on to the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible.A
VCC24COMMON I/OThis pin is not considered. This is a corner pin.D
Table 4-9 Pin FMA for Device Pins Short-Circuited to Supply
Pin Name Pin No. Description of Potential Failure Effects Failure Effect Class
COMMON I/O 1 There is corruption of the signal passed on to the IX pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I7 2 There is corruption of the signal passed on to the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I6 3 There is corruption of the signal passed on to the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I5 4 There is corruption of the signal passed on to the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I4 5 There is corruption of the signal passed on to the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I3 6 There is corruption of the signal passed on to the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I2 7 There is corruption of the signal passed on to the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I1 8 There is corruption of the signal passed on to the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I0 9 There is corruption of the signal passed on to the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
S0 10 The address is stuck high. The pin cannot control switch states. B
S1 11 The address is stuck high. The pin cannot control switch states. B
GND 12 The device is not powered and not functional. Observe that the absolute maximum ratings for all pins of the device are met; otherwise, damage to the device is possible. A
S3 13 The address is stuck high. The pin cannot control switch states. B
S2 14 The address is stuck high. The pin cannot control switch states. B
E 15 EN is stuck high. The pin can no longer enable the device. B
I15 16 There is corruption of the signal passed on to the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I14 17 There is corruption of the signal passed on to the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I13 18 There is corruption of the signal passed on to the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I12 19 There is corruption of the signal passed on to the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I11 20 There is corruption of the signal passed on to the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I10 21 There is corruption of the signal passed on to the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I9 22 There is corruption of the signal passed on to the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I8 23 There is corruption of the signal passed on to the COMMON pin. If there is no limiting resistor in the switch path, then device damage is possible. A
VCC 24 There is no effect on the device. The device operates as normal. D
Thermal Pad – No connect pin electrically floating, there is no effect on the device. D