SFFS994 May   2025 LM251772-Q1 , LM51772-Q1

 

  1.   1
  2.   Trademarks
  3. 1Overview
  4. 2Functional Safety Failure In Time (FIT) Rates
  5. 3Failure Mode Distribution (FMD)
  6. 4Revision History

3 Failure Mode Distribution (FMD)

The failure mode distribution estimation for the LM51772-Q1 and LM251772-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.

The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.

Table 3-1 Die Failure Modes and Distribution
Die Failure ModesFailure Mode Distribution (%)
HO1 and HO2 or LO1 and LO2 gate drivers are stuck on 10
HO1 and HO2 or LO1 and LO2 gate drivers are stuck off 20
HO1 and HO2 or LO1 and LO2 gate drivers are Hi-Z 3
VCC1 and VCC2 LDO output voltage out of specification 10
DRV1 or nFLT false switching 3
VOUT voltage out of specification 30
Average current out of specifications 14
Digital control malfunctions or electrical parameters are out of specification 10