1 Overview

This document contains information for the LM51772-Q1 and LM251772-Q1 (VQFN package) to aid in a functional safety system design. Information provided are:

• Functional safety failure in time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
• Component failure modes and distribution (FMD) based on the primary function of the device

Figure 1-1 shows the device functional block diagram for reference.

Figure 1-1 Functional Block Diagram of the LM51772-Q1

The LM51772-Q1 and LM251772-Q1 were developed using a quality-managed development process, but were not developed in accordance with the IEC 61508 or ISO 26262 standards.