SFFS990 May   2026 UCC27614-Q1

 

  1.   1
  2.   Trademarks
  3. 1Overview
  4. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 DSG (SON 8) Package
    2. 2.2 D (SOIC 8) Package
    3. 2.3 DGN (VSSOP 8) Package
  5. 3Failure Mode Distribution (FMD)
  6. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 DSG (SON 8) Package
    2. 4.2 D (SOIC 8) and DGN (VSSOP 8) Package
  7. 5Revision History

1 Overview

This document contains information for the UCC27614-Q1 (DSG (SON 8), D (SOIC 8), and DGN (VSSOP 8) packages) to aid in a functional safety system design. Information provided are:

  • Functional safety failure in time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (pin FMA)

Figure 1-1 and Figure 1-2 show the device functional block diagrams for reference.

UCC27614-Q1 Functional Block Diagram (DSG) Figure 1-1 Functional Block Diagram (DSG)
UCC27614-Q1 Functional Block Diagram (D and DGN) Figure 1-2 Functional Block Diagram (D and DGN)

The UCC27614-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.