SBOK079 October   2023 TPS7H2140-SEP

PRODUCTION DATA  

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
  12. 9 Event Rate Calculations
  13. 10Summary
  14. 11References

8 Single-Event Transients (SET)

SETs are defined as heavy-ion-induced transients upsets on the OUTX, the CS pin, and the FAULT pin of the TPS7H2140-SEP. SET testing was performed at room temperature (no external temperature control applied). The species used for the SET testing was 109Ag for a LETEFF = 48 MeV × cm2 / mg. For more details, see Section 5. Flux of approximately 105 ions / cm2 × s and a fluence of approximately 107 ions / cm2 were used for the SET runs.

One unit was tested across multiple input and output conditions to determine the worst case setup for SETs. This unit was tested with a VIN of 4.5, 12, and 28 V with loads of 2 A (0.5 A per channel) and 5.4 A (1.35 A per channel.) The worst case condition was found to be minimum VIN (4.5 V) and a low load, 2 A (0.5 A per channel), was shown to be the worst case in transients for OUTX, which is considered to be the most important signal. All five other units were only characterized at the worst case SET scenario.

OUTX SETs were characterized using a window trigger of ±3% around the nominal output voltage. To capture the SETs, a MSO58B, two NI PXI-5172 scope cards, and one NI PXI-5160 scope card was used to continuously monitor OUTX, CS, and FAULT. Each scope was operated independently from each other. The output voltage was monitored by using the TP12 and the TP14 test points on the board, while the CS was monitored using the TP10 test point, and FAULT from the TP9 test point.

The NI scopes were programmed to a sample rate of 10 M samples per second (S / s) and recorded 50 k samples, with a 20% pretrigger reference, in case of an event (trigger).

Under heavy-ions, the TPS7H2140-SEP exhibits three transient upsets that were fully recoverable without requiring external intervention.

  1. A brief transient of the output voltage (referred here as VOUT,SET). For the purpose of this report the transients were characterized for deviations –3% ≤ VOUT ≤ 3% from the nominal output voltage.
  2. A brief transient on the Current Sense (CS) pin. For the purpose of this report, the transients were characterized for deviations –4% ≤ VCS ≤ 4% from the nominal output voltage. This type of SET is referred to here as VCS,SET.
  3. A VFAULT upset ≤ nominal - 1 V on a negative-edge trigger.

Test conditions and results are listed in Table 8-3. Figure 8-2 shows typical time domain plots for all the different types of the observed SETs. Note that VOUT was not monitored on the scope that VCS was triggered from, and as a result, any VCS drops due to a VOUT,SET occurring cannot be classified.

Table 8-1 Summary of TPS7H2140-SEP SET Test Condition and Results Preproduction units refer to P-type symbolized units. Production units refers to units that completed the entire -SEP flow.
Run Number Unit Type Unit Number Ion LETEFF (MeV × cm2/mg) FLUX (ions × cm2/ mg) Fluence (Number ions) OUT1,SET (Number) ≥ |3%| OUT2,SET (Number) ≥ |3%| CSSET ≥ |4%| FAULTSET ≥ 1-V
19 Preproduction 1 109Ag 48 9.98 × 104 1.00 × 107 849 849 1673 25
20 Preproduction 1 109Ag 48 9.80 × 104 9.99 × 106 314 353 1351 34
21 Preproduction 1 109Ag 48 9.96 × 104 1.00 × 107 702 688 1773 17
22 Preproduction 1 109Ag 48 9.55 × 104 9.98× 106 208 204 2226 15
23 Preproduction 1 109Ag 48 9.02 × 104 9.96 × 106 208 204 1519 22
24 Preproduction 1 109Ag 48 1.10 × 105 9.97 × 106 175 175 2341 25
25 Preproduction 2 109Ag 48 1.16 × 105 9.96 × 106 751 759 1381 21
26 Preproduction 3 109Ag 48 1.07 × 105 1.00 × 107 548 849 1417 13
27 Preproduction 4 109Ag 48 1.09 × 105 1.00 × 107 788 775 1530 20
28 Production 5 109Ag 48 1.19 × 105 1.00 × 107 830 830 4879 25
29 Production 6 109Ag 48 9.48 × 104 9.97 × 106 852 852 4910 28

Using the MFTF method shown in Single-Event Effects (SEE) Confidence Interval Calculations, the upper-bound cross-section (using a 95% confidence level) is calculated for the different SETs as shown in Table 8-2.

Table 8-2 Upper Bound Cross Section for SETs at 95% Confidence Interval and Room Temperature
SET TypeTotal Fluence (Number of Ions)Total Number of UpsetsUpper Bound Cross Section (cm2 / device)
OUT1,SET ≥ |3%|10.83 × 10762255.89 × 10–5
OUT2,SET ≥ |3%|65386.19 × 10–5
CSSET ≥ |4%|250002.34 × 10–4
FAULTSET ≤ Nominal -1 V2452.56 × 10-6
GUID-20230913-SS0I-L075-XHTC-BGXP0SHVHMF7-low.svgFigure 8-1 Typical VOUT,SET
GUID-20230913-SS0I-DVQX-JSGJ-1H6FPZXJXGTJ-low.svgFigure 8-3 Typical FAULTSET
GUID-20230913-SS0I-ZRDT-88WM-7V4BJB650MTT-low.svgFigure 8-2 Typical CSSET