ZHCSMX0B September   2019  – December 2020 TPA6304-Q1

PRODUCTION DATA  

  1. 1 特性
  2. 2 应用
  3. 3 说明
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Typical Characteristics
      1. 6.6.1 Bridge-Tied Load (BTL), BD
      2. 6.6.2 Parallel Bridge-Tied Load (PBTL)
      3. 6.6.3 Bridge-Tied Load (BTL), 1SPW
      4. 6.6.4 Bridge-Tied Load (BTL), 384 kHz, BD
      5. 6.6.5 Bridge-Tied Load (BTL), 384 kHz, 1SPW
  7. 7 Parameter measurement information
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1  Single-Ended Analog Inputs
      2. 7.3.2  Gain Control
      3. 7.3.3  Class-D Operation and Spread Spectrum Control
        1. 7.3.3.1 High Frequency Pulse Width Modulator (PWM)
        2. 7.3.3.2 Clock Synchronization
        3. 7.3.3.3 Spread Spectrum Control
      4. 7.3.4  Gate Drive
      5. 7.3.5  Power FETs
      6. 7.3.6  Load Diagnostics
        1. 7.3.6.1 DC Load Diagnostics
          1. 7.3.6.1.1 Automatic DC Load Diagnostics at Device Initialization
          2. 7.3.6.1.2 Automatic DC Load Diagnostics During Hi-Z to MUTE or PLAY Transition
          3. 7.3.6.1.3 Manual Start of DC Load Diagnostics
          4. 7.3.6.1.4 Short-to-Ground
          5. 7.3.6.1.5 Short-to-Power
          6. 7.3.6.1.6 Shorted Load and Open Load
          7. 7.3.6.1.7 Line Output Diagnostics
        2. 7.3.6.2 AC Load Diagnostics
          1. 7.3.6.2.1 Operating Principal
          2. 7.3.6.2.2 Stimulus
          3. 7.3.6.2.3 Load Impedance
          4. 7.3.6.2.4 Tweeter Detection
          5. 7.3.6.2.5 Operation
      7. 7.3.7  Power Supply
        1. 7.3.7.1 Power-Supply Sequence
          1. 7.3.7.1.1 Power-Up Sequence
          2. 7.3.7.1.2 Power-Down Sequence
      8. 7.3.8  Device Initialization and Power-On-Reset (POR)
      9. 7.3.9  Protection and Monitoring
        1. 7.3.9.1 Over Current Protection
        2. 7.3.9.2 DC Detect
        3. 7.3.9.3 Load Current Limit
        4. 7.3.9.4 Clip Detect
        5. 7.3.9.5 Temperature Protection and Monitoring
          1. 7.3.9.5.1 Over Temperature Shutdown (OTSD)
          2. 7.3.9.5.2 Over Temperature Warning (OTW)
          3. 7.3.9.5.3 Thermal Gain Foldback (TGFB)
        6. 7.3.9.6 Power Failures
        7. 7.3.9.7 Load Dump Protection
      10. 7.3.10 Hardware Control Pins
        1. 7.3.10.1 FAULT Pin
        2. 7.3.10.2 STANDBY Pin
        3. 7.3.10.3 GPIO Pins
        4. 7.3.10.4 WARNING
        5. 7.3.10.5 MUTE
    4. 7.4 Device Functional Modes
      1. 7.4.1 Internal Reporting Signals
        1. 7.4.1.1 Fault Signal
        2. 7.4.1.2 Warning Signal
        3. 7.4.1.3 Clip Detect Signal
      2. 7.4.2 Device States and Flags
        1. 7.4.2.1 Audio Channel States
          1. 7.4.2.1.1 PROTECTIVE SHUTDOWN with AUTO RECOVERY State
          2. 7.4.2.1.2 PROTECTIVE SHUTDOWN State
            1. 7.4.2.1.2.1 Clear Fault
        2. 7.4.2.2 Status and Memory Registers
          1. 7.4.2.2.1 Status Registers
          2. 7.4.2.2.2 Memory Registers
      3. 7.4.3 Fault Events
        1. 7.4.3.1 Overview
        2. 7.4.3.2 Power Fault Events
          1. 7.4.3.2.1 DVDD POR
          2. 7.4.3.2.2 VBAT Over Voltage Fault
          3. 7.4.3.2.3 VBAT Under Voltage Fault
          4. 7.4.3.2.4 PVDD Over Voltage Fault
          5. 7.4.3.2.5 PVDD Under Voltage Fault
          6. 7.4.3.2.6 GVDD Fault
        3. 7.4.3.3 Over Temperature Shut Down (OTSD) Event
        4. 7.4.3.4 Over Current Shut Down (OCSD) Event
        5. 7.4.3.5 DC Fault Event
        6. 7.4.3.6 Load Current Fault Event
        7. 7.4.3.7 Invalid Clock Fault Event
      4. 7.4.4 Warning Events
        1. 7.4.4.1 Overview
        2. 7.4.4.2 Over Temperature Warning Event
        3. 7.4.4.3 Thermal Gain Foldback Warning Event
        4. 7.4.4.4 Load Current Warning Event
        5. 7.4.4.5 Clip Warning Event
    5. 7.5 Programming
      1. 7.5.1 I2C Serial Communication Bus
        1. 7.5.1.1 I2C Address Selection
      2. 7.5.2 I2C Bus Protocol
        1. 7.5.2.1 Random Write
        2. 7.5.2.2 Sequential Write
        3. 7.5.2.3 Random Read
        4. 7.5.2.4 Sequential Read
    6. 7.6 Register Maps
      1. 7.6.1 Registers
  9. 8 Application Information Disclaimer
    1. 8.1 Application Information
      1. 8.1.1 AM Radio Avoidance
      2. 8.1.2 Parallel BTL Operation (PBTL)
      3. 8.1.3 Reconstruction Filter Design
      4. 8.1.4 Bootstrap Capacitors
      5. 8.1.5 Line Driver Applications
    2. 8.2 Typical Applications
      1. 8.2.1 BTL Application
        1. 8.2.1.1 Design Requirements
        2. 8.2.1.2 Detailed Hardware Design Procedure
      2. 8.2.2 PBTL Application
        1. 8.2.2.1 Detailed Hardware Design Procedure
  10. 9 Power Supply Recommendations
  11. 10Layout
    1. 10.1 Layout Guidelines
      1. 10.1.1 Electrical Connection of Thermal Pad and Heat Sink
      2. 10.1.2 General Considerations
    2. 10.2 Layout Example
    3. 10.3 Thermal Considerations
  12. 11Device and Documentation Support
    1. 11.1 Documentation Support
      1. 11.1.1 Related Documentation
    2. 11.2 接收文档更新通知
    3. 11.3 支持资源
    4. 11.4 Trademarks
    5. 11.5 静电放电警告
    6. 11.6 术语表

封装选项

机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)
订购信息

7.4.3.1 Overview

The device creates fault events as outlined in Details On Generated Fault Events.

Table 7-7 Details On Generated Fault Events
Fault EventTypical ReasonChannel Status Reporting (1)Required User ResponseCurrent status (non-latched) reported inEvent latched and reported in (2)
VBAT Over Voltage FaultVBAT above limit'100'
PROTECTIVE SHUTDOWN with AUTO RECOVERY State		Apply VBAT within specPower Fault Status RegisterPower Fault Memory Register
VBAT Under Voltage FaultVBAT below limitApply VBAT within spec
PVDD Over Voltage FaultPVDD above limitApply PVDD within spec
PVDD Under Voltage FaultPVDD below limitApply PVDD within spec
GVDD FaultGVDD regulator fault
DVDD PORDVDD voltage dropped below POR limit or initial device startup'001'
Hi-Z State		Write initial device configuration via I2CN/A
Over Temperature SD - ChannelChannel temperature above limit'101'
PROTECTIVE SHUTDOWN State		Clear FaultTemperature (OTSD) and Clock Sync Fault Status RegisterTemperature (OTSD) and Clock Sync Fault Memory Register
Over Temperature SD - GlobalDie temperature above limit
Over Current Shut Down (OCSD) EventShort to ground or short to power'101'
PROTECTIVE SHUTDOWN State		Clear FaultN/AChannel Over Current and DC Detection Fault Memory Register
DC Fault EventDC voltage at device input
Load Current Fault EventShorted loadChannel Load Current Fault Memory Register
Invalid Clock Fault EventMissing clock signal while device set up as clock slave'100'
PROTECTIVE SHUTDOWN with AUTO RECOVERY State		Apply sync clock signal within nominal rangeTemperature (OTSD) and Clock Sync Fault Status RegisterTemperature (OTSD) and Clock Sync Fault Memory Register
If 'OTSD auto recovery' is enabled in Miscellaneous Control Register 3:
Over Temperature SD- ChannelChannel temperature above limit'100'

PROTECTIVE SHUTDOWN with AUTO RECOVERY State		Cool down deviceTemperature (OTSD) and Clock Sync Fault Status RegisterTemperature (OTSD) and Clock Sync Fault Memory Register
Over Temperature SD - GlobalDie temperature above limit
2. Reading the memory register clears its content. This does not clear fault conditions.