SLOS051F October   1987  – February 2026 TLC27M2 , TLC27M2A , TLC27M2B , TLC27M7

PRODUCTION DATA  

  1.   1
  2. Features
  3. Applications
  4. Description
  5. Device Comparison
  6. Pin Configuration and Functions
  7. Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  Dissipation Rating Table
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Electrical Characteristics
    5. 6.5  Electrical Characteristics
    6. 6.6  Electrical Characteristics
    7. 6.7  Electrical Characteristics
    8. 6.8  Electrical Characteristics
    9. 6.9  Electrical Characteristics
    10. 6.10 Operating Characteristics
    11. 6.11 Operating Characteristics
    12. 6.12 Operating Characteristics
    13. 6.13 Typical Characteristics
  8. Parameter Measurement Information
    1. 7.1 Single-Supply versus Split-Supply Test Circuits
    2. 7.2 Input Bias Current
    3. 7.3 Low-Level Output Voltage
    4. 7.4 Input Offset Voltage Temperature Coefficient
  9. Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Single-Supply Operation
      2. 8.1.2 Input Characteristics
      3. 8.1.3 Noise Performance
      4. 8.1.4 Output Characteristics
      5. 8.1.5 Feedback
      6. 8.1.6 Electrostatic-Discharge Protection
      7. 8.1.7 Latch-Up
    2. 8.2 Typical Application
  10. Device and Documentation Support
    1. 9.1 Device Support
    2. 9.2 Documentation Support
      1. 9.2.1 Related Documentation
    3. 9.3 Receiving Notification of Documentation Updates
    4. 9.4 Support Resources
    5. 9.5 Trademarks
    6. 9.6 Electrostatic Discharge Caution
    7. 9.7 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information
    1. 11.1 Tape and Reel Information
    2. 11.2 Mechanical Data

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Input Bias Current

Because of the high input impedance of the TLC27M2 and TLC27M7 operational amplifiers, attempts to measure the input bias current can result in erroneous readings. The bias current at normal room ambient temperature is typically less than 1pA, a value that is easily exceeded by leakages on the test socket. Two suggestions are offered to avoid erroneous measurements:

  1. Isolate the device from other potential leakage sources. Use a grounded shield around and between the device inputs (see Figure 7-4). Leakages that can otherwise flow to the inputs are shunted away
  2. Compensate for the leakage of the test socket by actually performing an input bias current test (using a picoammeter) with no device in the test socket. The actual input bias current can then be calculated by subtracting the open-socket leakage readings from the readings obtained with a device in the test socket.

One word of caution—many automatic testers as well as some bench-top operational amplifier testers use the servo-loop technique with a resistor in series with the device input to measure the input bias current (the voltage drop across the series resistor is measured and the bias current is calculated). This method requires that a device be inserted into the test socket to obtain a correct reading; therefore, an open-socket reading is not feasible using this method.

TLC27M2 TLC27M2A TLC27M2B TLC27M7 Isolation Metal Around Device
                    Inputs (JG and P Packages) Figure 7-4 Isolation Metal Around Device Inputs (JG and P Packages)