10 Revision History
Changes from December 1, 2013 to August 12, 2026 (from Revision L (December 2013) to Revision M (August 2026))
- Updated Device Information table to include body and package
dimensionsGo
- Added Applications, Device Information table, Pin
Configuration and Functions section, ESD Ratings table,
Thermal Information table, Feature Description section,
Device Functional Modes, Device and Documentation Support
section, and Mechanical, Packaging, and Orderable Information
sectionGo
- Added Device Information table.Go
- Updated the numbering format for tables, figures, and
cross-references throughout the documentGo
- Moved Tstg to Absolute Maximum Ratings table.Go
- Added Thermal Information tableGo
- Changed Junction-to-ambient thermal resistance value for DBV
package from: 206°C/W to: 357.1°C/WGo
- Changed Junction-to-ambient thermal resistance value for DCK
package from: 252°C/W to: 371°C/WGo
- Updated Overview, Application and Implementation,
Device and Documentation Support sections to extend detailed feature
descriptions and more detailed information. Go
- Added parallel trace spacing recommendation to layout guidelines.
Changed wording of "Avoid branches; buffer signals that must branch separately"
to "Avoid branches; buffer each signal that must branch
separately"Go
Changes from Revision K (March 2012) to Revision L (December 2013)
- Updated document to new TI data sheet format.Go
- Removed Ordering Information table.Go
- Updated operating temperature range.Go