ZHCSMM2C March   2022  – October 2023 LMH34400

PRODUCTION DATA  

  1.   1
  2. 特性
  3. 应用
  4. 说明
  5. Pin Configuration and Functions
  6. Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 Electrical Characteristics: Logic Threshold and Switching Characteristics
    7. 5.7 Typical Characteristics
  7. Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Clamping and Input Protection
      2. 6.3.2 ESD Protection
      3. 6.3.3 Single-Ended Output Stage
    4. 6.4 Device Functional Modes
      1. 6.4.1 Ambient Light Cancellation Mode
      2. 6.4.2 Power-Down Mode (Multiplexer Mode)
  8. Application and Implementation
    1. 7.1 Application Information
    2. 7.2 Typical Applications
      1. 7.2.1 LMH34400 Test Circuit
        1. 7.2.1.1 Design Requirements
        2. 7.2.1.2 Detailed Design Procedure
        3. 7.2.1.3 Application Curves
      2. 7.2.2 LMH34400 Signal Chain With Comparator
        1. 7.2.2.1 Design Requirements
        2. 7.2.2.2 Detailed Design Procedure
        3. 7.2.2.3 Application Curves
    3. 7.3 Power Supply Recommendations
    4. 7.4 Layout
      1. 7.4.1 Layout Guidelines
      2. 7.4.2 Layout Example
  9. Device and Documentation Support
    1. 8.1 Device Support
      1. 8.1.1 Development Support
    2. 8.2 Documentation Support
      1. 8.2.1 Related Documentation
    3. 8.3 Receiving Notification of Documentation Updates
    4. 8.4 支持资源
    5. 8.5 Trademarks
    6. 8.6 静电放电警告
    7. 8.7 术语表
  10. Revision History
  11. 10Mechanical, Packaging, and Orderable Information

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Detailed Design Procedure

Figure 7-2 shows the LMH34400 test circuit used to evaluate various bandwidth without using an optical input signal. The voltage source is dc biased close to the input bias voltage of the LMH34400 (approximately 2.5 V). The LMH34400 internal design is optimized to only source current out of the input pin (pin 1). When testing the LMH34400 with a network analyzer or other ac source, control the dc bias such that the sum of the input ac and dc components does not result in a sourcing current into the amplifier input.

In the configuration shown in Figure 7-2, there is a 50‑Ω series resistor that helps with any reflection into the observing instrument. The instrument can be any 50‑Ω impedance input device such as a vector network analyzer (VNA) or oscilloscope. This setup creates a voltage divider on the output and reduces the TIA amplitude by a factor of two. Make sure to consider this factor when interpreting the measured results.

The bandwidth of a transimpedance amplifier strongly depends on the capacitance of the photodiode (CPD) that is connected to the input pin of the amplifier. The larger the capacitance, the lower the closed-loop bandwidth. Figure 7-3 shows when the CPD that is connected to the LMH34400 is between 0 pF and 10 pF.

While bandwidth is inversely proportional to the photodiode capacitance, the input-referred current noise and photodiode capacitance are directly proportional. To measure the output noise, use the same circuit in Figure 7-2 with a simple modification. In this case, remove all components on the input pin except CPD. Figure 7-4 shows the impact of the input-referred noise density as the CPD is varied from 0 pF to 10 pF. As the capacitance increases, the amplitude and breadth of the high-frequency noise increases significantly.

Figure 7-5 shows the impact of an increasing photodiode capacitance on these two parameters in one plot. In this plot, the integrated input-referred noise is calculated over a fixed range of dc to 250 MHz. Both the small-signal bandwidth and integrated input-referred noise trend toward poorer performance as the capacitance increases. For the highest level of performance, minimize the photodiode capacitance. As the photodiode capacitance is proportional to the photodiode light-capturing area, the final value chosen is a compromise of several system variables and differs between applications.