ZHCSF68D May   2015  – July 2019 DRV8305-Q1

PRODUCTION DATA.  

  1. 特性
  2. 应用
  3. 说明
    1.     Device Images
      1.      简化原理图
  4. 修订历史记录
  5. Pin Configuration and Functions
    1.     Pin Functions
  6. Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 SPI Timing Requirements (Slave Mode Only)
    7. 6.7 Typical Characteristics
  7. Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Integrated Three-Phase Gate Driver
      2. 7.3.2 INHx/INLx: Gate Driver Input Modes
      3. 7.3.3 VCPH Charge Pump: High-Side Gate Supply
      4. 7.3.4 VCP_LSD LDO: Low-Side Gate Supply
      5. 7.3.5 GHx/GLx: Half-Bridge Gate Drivers
        1. 7.3.5.1 Smart Gate Drive Architecture: IDRIVE
        2. 7.3.5.2 Smart Gate Drive Architecture: TDRIVE
        3. 7.3.5.3 CSAs: Current Shunt Amplifiers
      6. 7.3.6 DVDD and AVDD: Internal Voltage Regulators
      7. 7.3.7 VREG: Voltage Regulator Output
      8. 7.3.8 Protection Features
        1. 7.3.8.1 Fault and Warning Classification
        2. 7.3.8.2 MOSFET Shoot-Through Protection (TDRIVE)
        3. 7.3.8.3 MOSFET Overcurrent Protection (VDS_OCP)
          1. 7.3.8.3.1 MOSFET dV/dt Turn On Protection (TDRIVE)
          2. 7.3.8.3.2 MOSFET Gate Drive Protection (GDF)
        4. 7.3.8.4 Low-Side Source Monitors (SNS_OCP)
        5. 7.3.8.5 Fault and Warning Operating Modes
      9. 7.3.9 Undervoltage Warning (UVFL), Undervoltage Lockout (UVLO), and Overvoltage (OV) Protection
        1. 7.3.9.1 Overtemperature Warning (OTW) and Shutdown (OTSD) Protection
        2. 7.3.9.2 Reverse Supply Protection
        3. 7.3.9.3 MCU Watchdog
        4. 7.3.9.4 VREG Undervoltage (VREG_UV)
        5. 7.3.9.5 Latched Fault Reset Methods
    4. 7.4 Device Functional Modes
      1. 7.4.1 Power Up Sequence
      2. 7.4.2 Standby State
      3. 7.4.3 Operating State
      4. 7.4.4 Sleep State
      5. 7.4.5 Limp Home or Fail Code Operation
    5. 7.5 Programming
      1. 7.5.1 SPI Communication
        1. 7.5.1.1 SPI
        2. 7.5.1.2 SPI Format
    6. 7.6 Register Maps
      1. 7.6.1 Status Registers
        1. 7.6.1.1 Warning and Watchdog Reset (Address = 0x1)
          1. Table 10. Warning and Watchdog Reset Register Description
        2. 7.6.1.2 OV/VDS Faults (Address = 0x2)
          1. Table 11. OV/VDS Faults Register Description
        3. 7.6.1.3 IC Faults (Address = 0x3)
          1. Table 12. IC Faults Register Description
        4. 7.6.1.4 VGS Faults (Address = 0x4)
          1. Table 13. Gate Driver VGS Faults Register Description
      2. 7.6.2 Control Registers
        1. 7.6.2.1 HS Gate Drive Control (Address = 0x5)
          1. Table 14. HS Gate Driver Control Register Description
        2. 7.6.2.2 LS Gate Drive Control (Address = 0x6)
          1. Table 15. LS Gate Driver Control Register Description
        3. 7.6.2.3 Gate Drive Control (Address = 0x7)
          1. Table 16. Gate Drive Control Register Description
        4. 7.6.2.4 IC Operation (Address = 0x9)
          1. Table 17. IC Operation Register Description
        5. 7.6.2.5 Shunt Amplifier Control (Address = 0xA)
          1. Table 18. Shunt Amplifier Control Register Description
        6. 7.6.2.6 Voltage Regulator Control (Address = 0xB)
          1. Table 19. Voltage Regulator Control Register Description
        7. 7.6.2.7 VDS Sense Control (Address = 0xC)
          1. Table 20. VDS Sense Control Register Description
  8. Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
        1. 8.2.2.1 Gate Drive Average Current
        2. 8.2.2.2 MOSFET Slew Rates
        3. 8.2.2.3 Overcurrent Protection
        4. 8.2.2.4 Current Sense Amplifiers
      3. 8.2.3 VREG Reference Voltage Input (DRV8305N)
      4. 8.2.4 Application Curves
  9. Power Supply Recommendations
    1. 9.1 Power Supply Consideration in Generator Mode
    2. 9.2 Bulk Capacitance
  10. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  11. 11器件和文档支持
    1. 11.1 文档支持
    2. 11.2 接收文档更新通知
    3. 11.3 社区资源
    4. 11.4 商标
    5. 11.5 静电放电警告
    6. 11.6 Glossary
  12. 12机械、封装和可订购信息

封装选项

机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)
订购信息

Absolute Maximum Ratings

over operating temperature range with respect to GND (unless otherwise noted)(1)
MIN MAX UNIT
Power supply pin voltage (PVDD) –0.3 45 V
Power supply pin voltage ramp rate (PVDD) 0 2 V/µs
High-side charge pump pin voltage (VCPH) –0.3 PVDD + 12 V
Low-side regulator pin voltage (VCP_LSD) –0.3 12 V
Charge pump 1 positive switching pin voltage (CP1H) PVDD – 1.5 PVDD + 12 V
Charge pump 2 positive switching pin voltage (CP2H) PVDD – 3 PVDD + 12 V
Charge pump negative switching pin voltage (CPxL) –0.3 PVDD V
High-side gate driver pin voltage (GHx) –5 57 V
Gate-to-source voltage difference (GHx-SHx), (GLx-SLx) –0.3 15 V
Low-side gate driver pin voltage (GLx) –3 12 V
High-side gate driver source voltage (SHx) –5 45 V
Transient 200-ns high-side gate driver source voltage (SHx) –7 45 V
High-side gate driver source voltage (SHx) –5 PVDD + 5 V
Low-side gate driver source voltage (SLx) –3 5 V
Transient 200-ns low-side gate driver source voltage (SLx) –5 5 V
Drain pin voltage (VDRAIN) –0.3 45 V
Control pin voltage (INHx, INLx, EN_GATE, SCLK, SDI, SCS, SDO, nFAULT, PWRGD) –0.3 5.5 V
Wake pin voltage (WAKE) –0.3 45 V
Sense amplifier voltage (SPx, SNx) –3 5 V
Transient 200-ns sense amplifier voltage (SPx, SNx) –5 5 V
Sense amplifier output pin voltage (SOx) –0.3 5.5 V
Externally applied reference voltage, DRV8305N (VREG) –0.3 5.5 V
Externally applied reference sink current, DRV8305N (VREG) 0 100 µA
Internal digital regulator voltage (DVDD) –0.3 3.6 V
Internal analog regulator voltage (AVDD) –0.3 5.5 V
Open drain pins sink current (nFAULT, PWRGD) 0 7 mA
Wake pin sink current (WAKE) – limit current with external resistor 0 1 mA
Junction temperature, TJ DRV8305xQPHPQ1 –40 150 °C
DRV8305xEPHPQ1(2)(3) –40 175 °C
Storage temperature, Tstg –55 150 °C
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
IC is designed to be operational up to TJ = 175°C. Internal overtemperature shutdown will be disabled by default on the DRV8305xEPHPQ1.
Because lifetime degrades exponentially at higher temperatures, operation between TJ = 150°C to 175°C must be limited to transient and infrequent events. For transient events between TJ = 150°C to 175°C for a total of 10 hours over lifetime, no degradation in lifetime is expected. Contact TI for lifetime impact if the use case requires TJ = 150°C to 175°C greater than 10 hours.