ZHCS887D May 2012 – April 2019 CDCUN1208LP
PRODUCTION DATA.
Figure 15. CDCUN1208LP LVDS Output - Test Setup
Figure 16. CDCUN1208LP LVDS Output - Propagation Delay/Skew Measurement Setup
Figure 17. CDCUN1208LP LVDS Output - Phase Noise/Jitter Measurement Setup Figure 18 shows the configuration used to measure the HCSL buffer characteristics. Either single-ended probes with math or differential probes can be used for differential measurements. The 50-Ω differential trace length is up to 15 inches.
Figure 18. CDCUN1208LP HCSL Output – Measurement Configuration With Load
Figure 19. CDCUN1208LP HCSL Output – Propagation Delay/Skew Measurement
Figure 20. CDCUN1208LP HCSL Output – Phase Noise/Jitter Measurement Configuration
Figure 21. CDCUN1208LP LVCMOS Output – Measurement Configuration
Figure 22. CDCUN1208LP LVCMOS Output – Phase Noise/Jitter Measurement Setup
Figure 23. CDCUN1208LP Universal Input - Differential Mode Measurement Setup
Figure 24. CDCUN1208LP Universal Input - Single-Ended Mode Measurement Setup
Figure 25. CDCUN1208LP Power Consumption Measurement Setup