ZHCS887D May 2012 – April 2019 CDCUN1208LP
PRODUCTION DATA.
| PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNITS | |
|---|---|---|---|---|---|---|
| 1.8-V MODE | ||||||
| fout | Output frequency range | 0.0008 | 250 | MHz | ||
| VOH | LVCMOS high-level output voltage | VDDOx = 1.7 V, IOH = –0.1 mA (All ERC Settings) | 1.6 | |||
| VDDOx = 1.7 V, IOH = –1.5 mA (ERC = SLOW) | 1.4 | V | ||||
| VDDOx = 1.7 V, IOH = –3 mA (ERC = MED) | ||||||
| VDDOx = 1.7 V, IOH = –4 mA (ERC = FAST) | ||||||
| VDDOx = 1.7 V, IOH = –3 mA (ERC = SLOW) | 1.1 | V | ||||
| VDDOx = 1.7 V, IOH = –5 mA (ERC = MED) | ||||||
| VDDOx = 1.7 V, IOH = –8 mA (ERC = FAST) | ||||||
| VOL | LVCMOS low-level output voltage | VDDOx = 1.7 V, IOL = 0.1 mA (All ERC Settings) | 0.1 | V | ||
| VDDOx = 1.7 V, IOL = 2 mA (ERC = SLOW) | 0.3 | V | ||||
| VDDOx = 1.7 V, IOL = 3 mA (ERC = MED) | ||||||
| VDDOx = 1.7 V, IOL = 4 mA (ERC = FAST) | ||||||
| VDDOx = 1.7 V, IOL = 3 mA (ERC = SLOW) | 0.6 | V | ||||
| VDDOx = 1.7 V, IOL = 5 mA (ERC = MED) | ||||||
| VDDOx = 1.7 V, IOL = 8 mA (ERC = FAST) | ||||||
| IOH | LVCMOS high-level output current | VDDOx = 1.8 V, VO = 0.5 V; TA = 25°C | –23 | mA | ||
| VDDOx = 1.8 V, VO = 0.9 V; TA = 25°C | –18 | |||||
| IOL | LVCMOS low-level output current | VDDOx = 1.8 V, VO = 1.4 V; TA = 25°C | 27 | mA | ||
| VDDOx = 1.8 V, VO = 0.9 V; TA = 25°C | 23 | |||||
| tPLH, tPHL | Propagation delay | 6.8 | ns | |||
| tSLEW-RATE | Output rise/fall slew rate | ERC = Slow, 20% to 80%, fout = 100 MHz, CL = 8 pF | 0.5 | V/ns | ||
| ERC = Medium 20% to 80%, fout = 100 MHz, CL = 8 pF | 0.8 | |||||
| ERC = Fast, 20% to 80%, fout = 250 MHz, CL = 8 pF | 2.7 | |||||
| tjitt-add | Additive jitter | fOUT = 100 MHz, 10k-20M integration bandwidth | 350 | fs | ||
| tsk(o) | Output skew(2) | 130 | ps | |||
| odc | Output duty cycle(1),(3) | fOUT = 100 MHz; Pdiv = 1, ERC = MED, FAST | 45% | 55% | ||
| tOE | Output enable to stable clock output | Pin mode. fout = 100 MHz, device in active mode with outputs disabled, OE asserted | 2 | µs | ||
| tPD | PD de-asserted to stable clock output | Host mode, fout = 100 MHz, device in power down mode, PD de-asserted | 10 | µs | ||
| tPU | Time from power applied to stable clock output(4) | Pin mode, fout = 100 MHz, OE asserted, measured from time VDD is valid to stable output. | 1 | ms | ||
Figure 1. HCSL Crossing Point Voltage
Figure 2. HCSL Variation of VCROSS Over All Rising Clock Edges
Figure 3. HCSL Ring Back Margin and Timing
Figure 4. HCSL Rise Fall Time and Edge Speed
Figure 5. HCSL Rise Fall Time Matching
Figure 6. HCSL Duty Cycle