ZHCSUL6 February 2024 ADC12DL1500 , ADC12DL2500 , ADC12DL500
PRODUCTION DATA
The ADC12DLx500 has an automatic SYSREF calibration feature to alleviate the often challenging setup and hold times associated with capturing SYSREF for giga-sample data converters. Automatic SYSREF calibration uses the tAD adjust feature to shift the device clock to maximize the SYSREF setup and hold times or to align the sampling instance based on the SYSREF rising edge.
The ADC12DLx500 must have a proper device clock applied and be programmed for normal operation before starting the automatic SYSREF calibration. When ready to initiate automatic SYSREF calibration, a continuous SYSREF signal must be applied. SYSREF must be a continuous (periodic) signal when using the automatic SYSREF calibration. Start the calibration process by setting SRC_EN high in the SYSREF calibration enable register after configuring the automatic SYSREF calibration using the SRC_CFG register. Upon setting SRC_EN high, the ADC12DLx500 searches for the optimal tAD adjust setting until the device clock falling edge is internally aligned to the SYSREF rising edge. SRC_DONE in the SYSREF calibration status register is monitored to make sure the SYSREF calibration has finished. By aligning the device clock falling edge with the SYSREF rising edge, automatic SYSREF calibration maximizes the internal SYSREF setup and hold times relative to the device clock, and also sets the sampling instant based on the SYSREF rising edge. After the automatic SYSREF calibration finishes, the rest of the start up procedure can be performed to finish bringing up the system.
For multi-device synchronization, the SYSREF rising edge timing must be matched at all devices and therefore trace lengths must be matched from a common SYSREF source to each ADC12DLx500. Any skew between the SYSREF rising edge at each device results in additional error in the sampling instance between devices, however repeatable deterministic latency from system start up to start up through each device must still be achieved.
Figure 6-3 provides a timing diagram of the SYSREF calibration procedure. The optimized setup and hold times are shown as tSU(OPT) and tH(OPT), respectively. The device clock and SYSREF are referred to as internal in this diagram because the phase of the internal signals are aligned within the device and not to the external (applied) phase of the device clock or SYSREF.
When finished, the tAD adjust setting found by the automatic SYSREF calibration can be read from SRC_TAD in the SYSREF calibration status register. After calibration, the system continues to use the calibrated tAD adjust setting for operation until the system is powered down. However, if desired, the SYSREF calibration can then be disabled and the tAD adjust setting can be fine-tuned according to the systems needs. Alternatively, the use of the automatic SYSREF calibration can be done at product test (or periodic recalibration) of the optimal tAD adjust setting for each system. This value can be stored and written to the TAD register (TAD_INV, TAD_COARSE, and TAD_FINE) upon system start up.
Do not run the SYSREF calibration when the ADC calibration is running. SYSREF_SEL in the clock control register 0 must be set to 0 when using SYSREF calibration.
SYSREF calibration searches the TAD_COARSE delays using both noninverted (TAD_INV = 0) and inverted clock polarity (TAD_INV = 1) to minimize the required TAD_COARSE setting to minimize loss on the clock path to reduce aperture jitter (tAJ).