ZHCSIW2C 数据表 | 德州仪器 TI.com.cn

ZHCSIW2C July 2000 – October 2018 LF198-N , LF298 , LF398-N

PRODUCTION DATA.

Figure 1. Aperture Time

Figure 3. Dynamic Sampling Error

Figure 5. Hold Step

Figure 7. Leakage Current into Hold Capacitor

Figure 9. Gain Error

Figure 11. Output Short Circuit Current

Figure 13. Input Bias Current

Figure 15. Hold Step vs Input Voltage

Figure 17. Output Transient at Start of Hold Mode

Figure 2. Dielectric Absorption Error in Hold Capacitor

Figure 4. Output Droop Rate

Figure 6. Hold Settling Time

Figure 8. Phase and Gain (Input to Output, Small Signal)

Figure 10. Power Supply Rejection

Figure 12. Output Noise

Figure 14. Feedthrough Rejection Ratio (Hold Mode)

Figure 16. Output Transient at Start of Sample Mode